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Table Of Contents
CONN Commands
Note The terms "Unidirectional Path Switched Ring" and "UPSR" may appear in Cisco literature. These terms do not refer to using Cisco ONS 15xxx products in a unidirectional path switched ring configuration. Rather, these terms, as well as "Path Protected Mesh Network" and "PPMN," refer generally to Cisco's path protection feature, which may be used in any topological network configuration. Cisco does not recommend using its path protection feature in any particular topological network configuration.
This chapter provides CONN (connect) commands for the Cisco ONS 15454, ONS 15327, ONS 15600 and ONS 15310-CL.
7.1 CONN-TACC-<MOD_TACC>
Connect Test Access (DS1, STS1, STS12C, STS18C, STS192C, STS24C, STS3C, STS48C, STS6C, STS9C, T1, T3, VT1, VT2)
Usage Guidelines
Cisco ONS 15454, ONS 15327, ONS 15600
See Table 27-1 for supported modifiers by platform.
This command connects the STS or VT defined by AID to the STS specified by the TAP number. For more information on TACC, refer to the Cisco ONS SONET TL1 Reference Guide.
Caution For this command to be applicable, you must first create the TAP using the ED-<MOD_PATH> command. Intrusive test access modes are traffic-affecting. If a facility/path is connected to a TAP in an intrusive test access mode, it is forced to go into the OOS-MT state. The forced transition could be traffic-affecting. The present state of the facility/path is stored by the NE and is restored when the TAP connection is brought down. Test access connections are dropped automatically if the TL1 session is terminated or is timed out.
Note•If all TAPs are busy, a RABY error message is returned.
•If a requested TAP is busy, a RTBY error message is returned.
•If a requested TAP does not exist, a RTEN error message is returned.
•If a circuit is already connected to another TAP, a SCAT error message is returned.
•If a requested condition already exists, a SRCN error message is returned.
•If the AID is invalid, an IIAC (Input, Invalid Access Identifier) error message is returned.
•If an access is not supported, an EANS error message is returned.
•If a requested access configuration is invalid, a SRAC error message is returned.
•A connection can be made to a cross-connection, in which case all modes of access are supported. A connection to an Unmapped AID (AID without a cross-connect on it) will allow only MONE, SPLTE, and LOOPE modes.
•A connection to the protect path of a 1+1, 1:1, or 1:N protection scheme is not allowed; however, connecting to the PCA path of a two-fiber or four-fiber BLSR is supported. This will be preempted when a BLSR switch occurs.
•When you connect a TACC to a protect path protection trunk, you will always be connected to the working trunk instead.
•STS36C is not supported in this release.
CategoryTroubleshooting and Test Access
SecurityMaintenance
Related Commands
Input FormatCONN-TACC-<MOD_TACC>:[<TID>]:<SRC>:<CTAG>::<TAP>:MD=<MD>;
Input ExampleCONN-TACC-STS1:CISCO:STS-2-1-4:123::8:MD=MONE;
Input Parameters
Table 7-1 CONN-TACC-<MOD_TACC> Input Parameters
Parameter and Values DescriptionSRC
Source AID from the "ALL" section. SRC must not be null
TAP
The Test Access Path number. The TAP number is used to identify all messages between TSC and NE until the access point is released. TAP number must be an integer with a range of 1 to 999. TAP must not be null
MD
The test access mode. (SPLTE, SPLTF, LOOPE and LOOPF require an external QRS input signal.) Single FAD Test Access does not support MONEF, SPLTEF & SPLTAB modes. MD must not be null
Parameter type is TACC_MODE—test access mode
•LOOPE
Splits both the A and B paths. Connect the line incoming from E direction to the line outgoing in the E direction, and connect this looped configuration to the FAD. The line outgoing in the F direction will have a QRS connected, and the line incoming from the F direction will be terminated by the nominal characteristic impedance of the line. Intrusive test access mode
•LOOPF
Splits both the A and B paths. Connects the line incoming from F direction to the line outgoing in the F direction, and connects this looped configuration to the FAD. The line outgoing in the E direction will have a QRS connected, and the line incoming from the E direction will be terminated by the nominal characteristic impedance of the line. Intrusive test access mode
•MONE
Indicates that a monitor connection is to be provided from the FAD to the A transmission path of the accessed circuit
•MONEF
Indicates that a monitor connection is to be provided from the FAD1 to a DFAD, or the odd pair of a FAP, to the A transmission path and from FAD2 of the same DFAD, or the even pair of a FAP, to the B transmission path of the accessed circuit.
•MONF
Indicates that a monitor connection is to be provided from the FAD to the B transmission path of the accessed circuit.
•SPLTA
Indicates that a connection is to be provided from both the E and F sides of the A transmission path of the circuit under test to the FAD and split the A transmission path. Intrusive test access mode
•SPLTB
Indicates that a connection is to be provided from both the E and F sides of the B transmission path of the circuit under test to the FAD and split the B transmission path. Intrusive test access mode
•SPLTE
Splits both the A and B paths and connects the E side of the accessed circuit to the FAD. The line outgoing in the F direction will have a QRS connected, and the line incoming from the F direction will have a QRS connected, and the line incoming from the E direction will be terminated by the nominal characteristic impedance of the line. Intrusive test access mode
•SPLTEF
Splits both the A and B paths, and connects the E side of the accessed circuit to FAD1 and the F side to FAD2. Intrusive test access mode
•SPLTF
Splits both the A and B paths, and connects the F side of the accessed circuit to the FAD. The line outgoing in the E direction will have a QRS connected, and the line incoming in the E direction will have a QRS connected. The line incoming from the E direction will be terminated by the nominal characteristic impedance of the line. Intrusive test access mode
Output FormatSID DATE TIME
M CTAG COMPLD
"<TAP>"
;Output ExampleTID-000 1998-06-20 14:30:00
M 001 COMPLD
"8"
;Output Parameters
Posted: Mon Sep 3 11:08:48 PDT 2007
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