This appendix lists the following diagnostic tests for the LightStream 2020 multiservice ATM switch (LS2020 switch):
Some of these tests may impede performance of your LS2020 node.
No.
| Name
| Card
| Notes
|
---|
01
| CP_Flash_Checksum_Test
| Line card
| FDM
|
02
| EEPROM_Checksum_Tests
|
|
|
02.01
| HC11_Configuration_EEPROM_Checksum_Test
| Line card
| DMT
|
02.02
| HC11_Application_EEPROM_Checksum_Test
| Line card
| DMT
|
02.03
| Access_Card_EEPROM_Checksum_Test
| Access card
| DMT
|
02.04
| Access_Card_OEM_EEPROM_Checksum_Test
| Access card
| DMT
|
03
| CP_DRAM_Tests
|
|
|
03.01
| CP_to_DRAM_AddrBus_Indep_Test
| Line card
| FXM
|
03.02
| CP_to_DRAM_AddrBus_Walking_1s_Test
| Line card
| FDM
|
03.03
| CP_to_DRAM_AddrBus_Walking_0s_Test
| Line card
| FDM
|
03.04
| CP_to_DRAM_DataBus_WalkingBit_Test
| Line card
| FXM
|
03.05
| CP_to_DRAM_StuckBit_Memory_Test
| Line card
| FDM
|
03.06
| CP_to_DRAM_RamData_Pattern_Test
| Line card
| FDM
|
03.07
| CP_to_DRAM_Marching_1s_Test
| Line card
| FXM
|
03.08
| CP_to_DRAM_Refresh_Test
| Line card
| FXM
|
04
| CP_Parity_Test
| Line card
| FXM
|
05
| CP_Parity_Buffer_Test
| Line card
| FXM
|
06
| CP_Parity_DRAM_Test
| Line card
| FDM
|
07
| TSU_NQP_uStore_Memory_Tests
|
|
|
07.01
| NQP_uStore_AddrBus_Indep_Test
| Line card
| FXAM
|
07.02
| NQP_uStore_AddrBus_Walking_1s_Test
| Line card
| FDAM
|
07.03
| NQP_uStore_AddrBus_Walking_0s_Test
| Line card
| FDAM
|
07.04
| NQP_uStore_DataBus_WalkingBit_Test
| Line card
| FXAM
|
07.05
| NQP_uStore_StuckBit_Memory_Test
| Line card
| FDAM
|
07.06
| NQP_uStore_RamData_Pattern_Test
| Line card
| FDAM
|
07.07
| NQP_uStore_Marching_1s_Test
| Line card
| FXAM
|
08
| TSU_DQP_uStore_Memory_Tests
|
|
|
08.01
| DQP_uStore_AddrBus_Indep_Test
| Line card
| FXAM
|
08.02
| DQP_uStore_AddrBus_Walking_1s_Test
| Line card
| FDAM
|
08.03
| DQP_uStore_AddrBus_Walking_0s_Test
| Line card
| FDAM
|
08.04
| DQP_uStore_DataBus_WalkingBit_Test
| Line card
| FXAM
|
08.05
| DQP_uStore_StuckBit_Memory_Test
| Line card
| FDAM
|
08.06
| DQP_uStore_RamData_Pattern_Test
| Line card
| FDAM
|
08.07
| DQP_uStore_Marching_1s_Test
| Line card
| FXAM
|
09
| TSU_Internal_Timer_SRAM_Tests
|
|
|
09.01
| TSU_Timer_SRAM_AddrBus_Indep_Test
| Line card
| FXAM
|
09.02
| TSU_Timer_SRAM_AddrBus_Walking_1s_Test
| Line card
| FDAM
|
09.03
| TSU_Timer_SRAM_AddrBus_Walking_0s_Test
| Line card
| FDAM
|
09.04
| TSU_Timer_SRAM_DataBus_WalkingBit_Test
| Line card
| FXAM
|
09.05
| TSU_Timer_SRAM_StuckBit_Memory_Test
| Line card
| FDAM
|
09.06
| TSU_Timer_SRAM_RamData_Pattern_Test
| Line card
| FDAM
|
09.07
| TSU_Timer_SRAM_Marching_1s_Test
| Line card
| FXAM
|
10
| TSU_Internal_CellFifo_SRAM_Tests
|
|
|
10.01
| TSU_CellFifo_AddrBus_Indep_Test
| Line card
| FXAM
|
10.02
| TSU_CellFifo_AddrBus_Walking_1s_Test
| Line card
| FDAM
|
10.03
| TSU_CellFifo_AddrBus_Walking_0s_Test
| Line card
| FDAM
|
10.04
| TSU_CellFifo_DataBus_WalkingBit_Test
| Line card
| FXAM
|
10.05
| TSU_CellFifo_StuckBit_Memory_Test
| Line card
| FDAM
|
10.06
| TSU_CellFifo_RamData_Pattern_Test
| Line card
| FDAM
|
10.07
| TSU_CellFifo_Marching_1s_Test
| Line card
| FXAM
|
11
| TSU_B_NQP_uStore_Memory_Tests
|
|
|
11.01
| NQP_B_uStore_AddrBus_Indep_Test
| Line card
| FXAM
|
11.02
| NQP_B_uStore_AddrBus_Walking_1s_Test
| Line card
| FDAM
|
11.03
| NQP_B_uStore_AddrBus_Walking_0s_Test
| Line card
| FDAM
|
11.04
| NQP_B_uStore_DataBus_WalkingBit_Test
| Line card
| FXAM
|
11.05
| NQP_B_uStore_StuckBit_Memory_Test
| Line card
| FDAM
|
11.06
| NQP_B_uStore_RamData_Pattern_Test
| Line card
| FDAM
|
11.07
| NQP_B_uStore_Marching_1s_Test
| Line card
| FXAM
|
12
| TSU_B_DQP_uStore_Memory_Tests
|
|
|
12.01
| DQP_B_uStore_AddrBus_Indep_Test
| Line card
| FXAM
|
12.02
| DQP_B_uStore_AddrBus_Walking_1s_Test
| Line card
| FDAM
|
12.03
| DQP_B_uStore_AddrBus_Walking_0s_Test
| Line card
| FDAM
|
12.04
| DQP_B_uStore_DataBus_WalkingBit_Test
| Line card
| FXAM
|
12.05
| DQP_B_uStore_StuckBit_Memory_Test
| Line card
| FDAM
|
12.06
| DQP_B_uStore_RamData_Pattern_Test
| Line card
| FDAM
|
12.07
| DQP_B_uStore_Marching_1s_Test
| Line card
| FXAM
|
13
| TSU_B_Internal_Timer_SRAM_Tests
|
|
|
13.01
| TSU_B_Timer_SRAM_AddrBus_Indep_Test
| Line card
| FXAM
|
13.02
| TSU_B_Timer_SRAM_AddrBus_Walking_1s_Test
| Line card
| FDAM
|
13.03
| TSU_B_Timer_SRAM_AddrBus_Walking_0s_Test
| Line card
| FDAM
|
13.04
| TSU_B_Timer_SRAM_DataBus_WalkingBit_Test
| Line card
| FXAM
|
13.05
| TSU_B_Timer_SRAM_StuckBit_Memory_Test
| Line card
| FDAM
|
13.06
| TSU_B_Timer_SRAM_RamData_Pattern_Test
| Line card
| FDAM
|
13.07
| TSU_B_Timer_SRAM_Marching_1s_Test
| Line card
| FXAM
|
14
| TSU_B_Internal_CellFifo_SRAM_Tests
|
|
|
14.01
| TSU_B_CellFifo_AddrBus_Indep_Test
| Line card
| FXAM
|
14.02
| TSU_B_CellFifo_AddrBus_Walking_1s_Test
| Line card
| FDAM
|
14.03
| TSU_B_CellFifo_AddrBus_Walking_0s_Test
| Line card
| FDAM
|
14.04
| TSU_B_CellFifo_DataBus_WalkingBit_Test
| Line card
| FXAM
|
14.05
| TSU_B_CellFifo_StuckBit_Memory_Test
| Line card
| FDAM
|
14.06
| TSU_B_CellFifo_RamData_Pattern_Test
| Line card
| FDAM
|
14.07
| TSU_B_CellFifo_Marching_1s_Test
| Line card
| FXAM
|
15
| FSU_OSMC_uStore_Memory_Tests
|
|
|
15.01
| OSMC_uStore_AddrBus_Indep_Test
| Line card
| FXAM
|
15.02
| OSMC_uStore_AddrBus_Walking_1s_Test
| Line card
| FDAM
|
15.03
| OSMC_uStore_AddrBus_Walking_0s_Test
| Line card
| FDAM
|
15.04
| OSMC_uStore_DataBus_WalkingBit_Test
| Line card
| FXAM
|
15.05
| OSMC_uStore_StuckBit_Memory_Test
| Line card
| FDAM
|
15.06
| OSMC_uStore_RamData_Pattern_Test
| Line card
| FDAM
|
15.07
| OSMC_uStore_Marching_1s_Test
| Line card
| FXAM
|
16
| FSU_ISMC_uStore_Memory_Tests
|
|
|
16.01
| ISMC_uStore_AddrBus_Indep_Test
| Line card
| FXAM
|
16.02
| ISMC_uStore_AddrBus_Walking_1s_Test
| Line card
| FDAM
|
16.03
| ISMC_uStore_AddrBus_Walking_0s_Test
| Line card
| FDAM
|
16.04
| ISMC_uStore_DataBus_WalkingBit_Test
| Line card
| FXAM
|
16.05
| ISMC_uStore_StuckBit_Memory_Test
| Line card
| FDAM
|
16.06
| ISMC_uStore_RamData_Pattern_Test
| Line card
| FDAM
|
16.07
| ISMC_uStore_Marching_1s_Test
| Line card
| FXAM
|
17
| TSU_Register_Walking_1s_and_0s_Test
| Line card
| FDA
|
18
| TSU_B_Register_Walking_1s_and_0s_Test
| Line card
| FDA
|
19
| FSU_Register_Walking_1s_and_0s_Test
| Line card
| FDA
|
20
| TSU_uDiagnostic_Tests
|
|
|
20.01
| TSU_Generic_Tests
| Line card
| DA
|
20.02
| TSU_NQP_External_Tests
| Line card
| DA
|
20.03
| TSU_NQP_Cell_Buffer_Tests
| Line card
| DAM
|
20.04
| TSU_NQP_Control_RAM_Tests
| Line card
| DAM
|
20.05
| TSU_NQP_ScratchPad_Tests
| Line card
| DAM
|
20.06
| TSU_NQP_PDBS_Tests
| Line card
| DA
|
20.07
| TSU_NQP_Miscellaneous_Tests
| Line card
| DA
|
20.08
| TSU_DQP_External_Tests
| Line card
| DA
|
20.09
| TSU_DQP_Cell_Buffer_Tests
| Line card
| DAM
|
20.10
| TSU_DQP_Control_RAM_Tests
| Line card
| DAM
|
20.11
| TSU_DQP_ScratchPad_Tests
| Line card
| DAM
|
20.12
| TSU_NQP_RamTests
| Line card
| AM
|
20.13
| TSU_DQP_RamTests
| Line card
| AM
|
21
| TSU_B_uDiagnostic_Tests
|
|
|
21.01
| TSU_B_Generic_Tests
| Line card
| DA
|
21.02
| TSU_B_NQP_External_Tests
| Line card
| DA
|
21.03
| TSU_B_NQP_Cell_Buffer_Tests
| Line card
| DAM
|
21.04
| TSU_B_NQP_Control_RAM_Tests
| Line card
| DAM
|
21.05
| TSU_B_NQP_ScratchPad_Tests
| Line card
| DAM
|
21.06
| TSU_B_NQP_PDBS_Tests
| Line card
| DA
|
21.07
| TSU_B_NQP_Miscellaneous_Tests
| Line card
| DA
|
21.08
| TSU_B_DQP_External_Tests
| Line card
| DA
|
21.09
| TSU_B_DQP_Cell_Buffer_Tests
| Line card
| DAM
|
21.10
| TSU_B_DQP_Control_RAM_Tests
| Line card
| DAM
|
21.11
| TSU_B_DQP_ScratchPad_Tests
| Line card
| DAM
|
21.12
| TSU_B_NQP_RamTests
| Line card
| AM
|
21.13
| TSU_B_DQP_RamTests
| Line card
| AM
|
22
| FSU_uDiagnostic_Tests
|
|
|
22.01
| FSU_Generic_Tests
| Line card
| DA
|
22.02
| FSU_ISMC_External_Tests
| Line card
| DA
|
22.03
| FSU_ISMC_IRAM_Tests
| Line card
| DAM
|
22.04
| FSU_ISMC_Miscellaneous_Tests
| Line card
| DA
|
22.05
| FSU_ISMC_LRIC_Tests
| Line card
| DA
|
22.06
| FSU_OSMC_External_Tests
| Line card
| DA
|
22.07
| FSU_OSMC_IRAM_Tests
| Line card
| DAM
|
22.08
| FSU_OSMC_Miscellaneous_Tests
| Line card
| DA
|
22.09
| FSU_OSMC_LRIC_Tests
| Line card
| DA
|
22.10
| FSU_OSMC_CRIC_Tests
| Line card
| DA
|
22.11
| FSU_OSMC_PDBS_Tests
| Line card
| DA
|
22.12
| FSU_OSMC_Priority_Encoder_Tests
| Line card
| DA
|
22.13
| FSU_ISMC_RamTests
| Line card
| AM
|
22.14
| FSU_OSMC_RamTests
| Line card
| AM
|
23
| FSU_RealTimeClock_Test
| Line card
| FXA
|
24
| FSU_IntervalTimer_Test
| Line card
| FXA
|
25
| TCS_NMI_Test
| Line card
| DT
|
26
| TSU_Internal_ScratchPad_SRAM_Tests
|
|
|
26.01
| TSU_SPAD_SRAM_AddrBus_Indep_Test
| Line card
| FXAM
|
26.02
| TSU_SPAD_SRAM_AddrBus_Walking_1s_Test
| Line card
| FDAM
|
26.03
| TSU_SPAD_SRAM_AddrBus_Walking_0s_Test
| Line card
| FDAM
|
26.04
| TSU_SPAD_SRAM_DataBus_WalkingBit_Test
| Line card
| FXAM
|
26.05
| TSU_SPAD_SRAM_StuckBit_Memory_Test
| Line card
| FDAM
|
26.06
| TSU_SPAD_SRAM_RamData_Pattern_Test
| Line card
| FDAM
|
26.07
| TSU_SPAD_SRAM_Marching_1s_Test
| Line card
| FXAM
|
27
| TSU_External_CellBuffer_DRAM_Tests
|
|
|
27.01
| TSU_CBuf_DRAM_AddrBus_Indep_Test
| Line card
| FXM
|
27.02
| TSU_CBuf_DRAM_AddrBus_Walking_1s_Test
| Line card
| FDM
|
27.03
| TSU_CBuf_DRAM_AddrBus_Walking_0s_Test
| Line card
| FDM
|
27.04
| TSU_CBuf_DRAM_DataBus_WalkingBit_Test
| Line card
| FXM
|
27.05
| TSU_CBuf_DRAM_StuckBit_Memory_Test
| Line card
| FDM
|
27.06
| TSU_CBuf_DRAM_RamData_Pattern_Test
| Line card
| FDM
|
27.07
| TSU_CBuf_DRAM_Marching_1s_Test
| Line card
| FXM
|
28
| TSU_External_Control_DRAM_Tests
|
|
|
28.01
| TSU_Ctrl_DRAM_AddrBus_Indep_Test
| Line card
| FXM
|
28.02
| TSU_Ctrl_DRAM_AddrBus_Walking_1s_Test
| Line card
| FDM
|
28.03
| TSU_Ctrl_DRAM_AddrBus_Walking_0s_Test
| Line card
| FDM
|
28.04
| TSU_Ctrl_DRAM_DataBus_WalkingBit_Test
| Line card
| FXM
|
28.05
| TSU_Ctrl_DRAM_StuckBit_Memory_Test
| Line card
| FDM
|
28.06
| TSU_Ctrl_DRAM_RamData_Pattern_Test
| Line card
| FDM
|
28.07
| TSU_Ctrl_DRAM_Marching_1s_Test
| Line card
| FXM
|
29
| TSU_B_Internal_ScratchPad_SRAM_Tests
|
|
|
29.01
| TSU_B_SPAD_SRAM_AddrBus_Indep_Test
| Line card
| FXAM
|
29.02
| TSU_B_SPAD_SRAM_AddrBus_Walking_1s_Test
| Line card
| FDAM
|
29.03
| TSU_B_SPAD_SRAM_AddrBus_Walking_0s_Test
| Line card
| FDAM
|
29.04
| TSU_B_SPAD_SRAM_DataBus_WalkingBit_Test
| Line card
| FXAM
|
29.05
| TSU_B_SPAD_SRAM_StuckBit_Memory_Test
| Line card
| FDAM
|
29.06
| TSU_B_SPAD_SRAM_RamData_Pattern_Test
| Line card
| FDAM
|
29.07
| TSU_B_SPAD_SRAM_Marching_1s_Test
| Line card
| FXAM
|
30
| TSU_B_External_CellBuffer_DRAM_Tests
|
|
|
30.01
| TSU_B_CBuf_DRAM_AddrBus_Indep_Test
| Line card
| FXM
|
30.02
| TSU_B_CBuf_DRAM_AddrBus_Walking_1s_Test
| Line card
| FDM
|
30.03
| TSU_B_CBuf_DRAM_AddrBus_Walking_0s_Test
| Line card
| FDM
|
30.04
| TSU_B_CBuf_DRAM_DataBus_WalkingBit_Test
| Line card
| FXM
|
30.05
| TSU_B_CBuf_DRAM_StuckBit_Memory_Test
| Line card
| FDM
|
30.06
| TSU_B_CBuf_DRAM_RamData_Pattern_Test
| Line card
| FDM
|
30.07
| TSU_B_CBuf_DRAM_Marching_1s_Test
| Line card
| FXM
|
31
| FSU_Internal_SRAM_Tests
|
|
|
31.01
| FSU_Int_SRAM_AddrBus_Indep_Test
| Line card
| FDAM
|
31.02
| FSU_Int_SRAM_AddrBus_Walking_1s_Test
| Line card
| FDAM
|
31.03
| FSU_Int_SRAM_AddrBus_Walking_0s_Test
| Line card
| FDAM
|
31.04
| FSU_Int_SRAM_DataBus_WalkingBit_Test
| Line card
| FDAM
|
31.05
| FSU_Int_SRAM_StuckBit_Memory_Test
| Line card
| FDAM
|
31.06
| FSU_Int_SRAM_RamData_Pattern_Test
| Line card
| FDAM
|
31.07
| FSU_Int_SRAM_Marching_1s_Test
|
|
|
32
| FSU_External_LRIC_SRAM_Tests
|
|
|
32.01
| FSU_LRIC_SRAM_AddrBus_Indep_Test
| Line card
| FXM
|
32.02
| FSU_LRIC_SRAM_AddrBus_Walking_1s_Test
| Line card
| FDM
|
32.03
| FSU_LRIC_SRAM_AddrBus_Walking_0s_Test
| Line card
| FDM
|
32.04
| FSU_LRIC_SRAM_DataBus_WalkingBit_Test
| Line card
| FXM
|
32.05
| FSU_LRIC_SRAM_StuckBit_Memory_Test
| Line card
| FDM
|
32.06
| FSU_LRIC_SRAM_RamData_Pattern_Test
| Line card
| FDM
|
32.07
| FSU_LRIC_SRAM_Marching_1s_Test
| Line card
| FXM
|
33
| FSU_External_CRIC_DRAM_Tests
|
|
|
33.01
| FSU_CRIC_DRAM_AddrBus_Indep_Test
| Line card
| FXM
|
33.02
| FSU_CRIC_DRAM_AddrBus_Walking_1s_Test
| Line card
| FDM
|
33.03
| FSU_CRIC_DRAM_AddrBus_Walking_0s_Test
| Line card
| FDM
|
33.04
| FSU_CRIC_DRAM_DataBus_WalkingBit_Test
| Line card
| FXM
|
33.05
| FSU_CRIC_DRAM_StuckBit_Memory_Test
| Line card
| FDM
|
33.06
| FSU_CRIC_DRAM_RamData_Pattern_Test
| Line card
| FDM
|
33.07
| FSU_CRIC_DRAM_Marching_1s_Test
| Line card
| FXM
|
34
| TSU_Functional_Register_Tests
|
|
|
34.01
| TSU_A_NQP_Interrupt_test
| Line card
| FDA
|
34.02
| TSU_A_DQP_Interrupt_test
| Line card
| FDA
|
34.03
| TSU_A_CBUF_Error_Interrupt_test
| Line card
| FDA
|
34.04
| TSU_A_CRAM_Error_Interrupt_test
| Line card
| FDA
|
34.05
| TSU_A_PDBI_Error_Interrupt_test
| Line card
| FDA
|
34.06
| TSU_A_Force_NQP_Trap_test
| Line card
| FDA
|
34.07
| TSU_A_Force_DQP_Trap_test
| Line card
| FDA
|
35
| TSU_B_Functional_Register_Tests
|
|
|
35.01
| TSU_B_NQP_Interrupt_test
| Line card
| FDA
|
35.02
| TSU_B_DQP_Interrupt_test
| Line card
| FDA
|
35.03
| TSU_B_CBUF_Error_Interrupt_test
| Line card
| FDA
|
35.04
| TSU_B_CRAM_Error_Interrupt_test
| Line card
| FDA
|
35.05
| TSU_B_PDBI_Error_Interrupt_test
| Line card
| FDA
|
35.06
| TSU_B_Force_NQP_Trap_test
| Line card
| FDA
|
35.07
| TSU_B_Force_DQP_Trap_test
| Line card
| FDA
|
36
| FSU_Functional_Register_Tests
|
|
|
36.01
| FSU_ISMC_Interrupt_test
| Line card
| FDA
|
36.02
| FSU_OSMC_Interrupt_test
| Line card
| FDA
|
36.03
| FSU_IVAL_Interrupt_test
| Line card
| FDA
|
36.04
| FSU_PDBI_Error_Interrupt_test
| Line card
| FDA
|
36.05
| FSU_TRAP_Error_Interrupt_test
| Line card
| FDA
|
36.06
| FSU_CAVL_Interrupt_test
| Line card
| FDA
|
36.07
| FSU_Force_OSMC_Trap_test
| Line card
| FDA
|
36.08
| FSU_Force_ISMC_Trap_test
| Line card
| FDA
|
37
| Cell_lpbk_Tsu_A_Ext_SWA_Test
| Line card
| FSA
|
38
| Cell_lpbk_Tsu_A_Ext_SWB_Test
| Line card
| FSA
|
39
| Cell_lpbk_Tsu_B_Ext_SWA_Test
| Line card
| FSA
|
40
| Cell_lpbk_Tsu_B_Ext_SWB_Test
| Line card
| FSA
|
41
| Cell_lpbk_Tsu_A_Int_SWA_Test
| Line card
| FDA
|
42
| Cell_lpbk_Tsu_A_Int_SWB_Test
| Line card
| FDA
|
43
| Cell_lpbk_Tsu_B_Int_SWA_Test
| Line card
| FDA
|
44
| Cell_lpbk_Tsu_B_Int_SWB_Test
| Line card
| FDA
|
45
| Cell_lpbk_Tsu_A_Int_SWA_FSU_B_Test
| Line card
| FDA
|
46
| Cell_lpbk_Tsu_A_Int_SWB_FSU_A_Test
| Line card
| FDA
|
47
| RATO_lpbk_Tsu_A_Int_SWA_Test
| Line card
| FDA
|
48
| Metering__Tsu_A_Int_SWA_Test
| Line card
| FDA
|
49
| OC3_Access_Card_Tests
|
|
|
49.01
| OC3_Access_Voltage_Sensor_Test
| Access card
| FDT
|
49.02
| OC3_Access_Temperature_Sensor_Test
| Access card
| FDT
|
49.03
| OC3_PMC5345_Register_Test
| Access card
| FD
|
49.04
| OC3_Nettime_PLL_Local_Test
| Access card
| FD
|
49.05
| OC3_Nettime_PLL_SWA_Test
| Access card
| N
|
49.06
| OC3_Nettime_PLL_SWB_Test
| Access card
| N
|
49.07
| OC3_Nettime_PLL_SWA_SWB_Test
| Access card
| N
|
49.08
| OC3_IRQ1_Interrupt_Test
| Access card
| FD
|
49.09
| OC3_IRQ0_Interrupt_Test
| Access card
| FD
|
49.10
| OC3_Internal_Lpbk_Test
| Access card
| FD
|
49.11
| OC3_Internal_Multi_VCI_Lpbk_Test
| Access card
| FD
|
49.12
| OC3_Internal_MultiCast_Lpbk_Test
| Access card
| FD
|
49.13
| OC3_External_Lpbk_Test
| Access card
| FL
|
49.14
| OC3_External_Multi_VCI_Lpbk_Test
| Access card
| FL
|
49.15
| OC3_External_MultiCast_Lpbk_Test
| Access card
| FL
|
49.16
| OC3_External_Cross_Test
| Access card
| FL
|
49.17
| OC3_External_MultiCast_Cross_Test
| Access card
| FL
|
49.18
| OC3_External_Cross_Line_Lpbk_Test
| Access card
| FL
|
49.19
| OC3_External_Port1_LoopT_Cross_Test
| Access card
| FL
|
49.20
| OC3_External_Port2_LoopT_Cross_Test
| Access card
| FL
|
49.21
| OC3_Manual_Tests
|
|
|
49.21.01
| OC3_Access_EEPROM_Test
| Access card
| MT
|
49.21.02
| OC3_Access_OEM_EEPROM_Test
| Access card
| MT
|
49
| T3_Access_Card_Tests
|
|
|
49
| E3_Access_Card_Tests
|
|
|
49
| E2_Access_Card_Tests
|
|
|
49.01
| T3E3/2_Access_Voltage_Sensor_Test
| Access card
| FD
|
49.02
| T3E3/2_Access_Temperature_Sensor_Test
| Access card
| FD
|
49.03
| T3E3/2_PDH_Register_Test
| Access card
| FD
|
49.04
| T3E3/2_Nettime_PLL_Local_Reference_Test
| Access card
| FD
|
49.05
| T3E3/2_Nettime_PLL_SWA_Test
| Access card
| FD
|
49.06
| T3E3/2_Nettime_PLL_SWB_Test
| Access card
| FD
|
49.07
| T3E3/2_Nettime_PLL_SWA_SWB_Test
| Access card
| FD
|
49.08
| T3E3/2_PerPort_PDH_Lpbk_Test
| Access card
| FD
|
49.09
| E2_PerPort_FMR_Lpbk_Test
| Access card
| FD
|
49.10
| T3E3/2_PerPort_ART/MRT_Lpbk_Test
| Access card
| FD
|
49.11
| T3E3/2_PerPort_Extrnl_Lpbk_Test
| Access card
| FL
|
49.12
| T3E3/2_MultiPorts_PDH_Lpbk_Test
| Access card
| FD
|
49.13
| T3E3/2_MultiPorts_ART/MRT_Lpbk_Test
| Access card
| FD
|
49.14
| T3E3/2_Multi_VCI_Ports_PDH_Lpbk_Test
| Access card
| Z
|
49.15
| T3E3/2_Multi_VCI_Ports_ART/MRT_Lpbk_Test
| Access card
| Z
|
49.16
| T3E3/2_Internal_MultiCast_TsuA_Test
| Access card
| FD
|
49.17
| T3E3/2_Internal_MultiCast_TsuB_Test
| Access card
| FD
|
49.18
| T3E3/2_Access_EEPROM_Test
| Access card
| MT
|
49.19
| T3E3/2_Access_OEM_EEPROM_Test
| Access card
| MT
|
No.
| Name
| Card
| Notes
|
---|
01
| CP_Flash_Checksum_Test
| Line card
| FDM
|
02
| EEPROM_Checksum_Tests
|
|
|
02.01
| HC11_Configuration_EEPROM_Checksum_Test
| Line card
| DMT
|
02.02
| HC11_Application_EEPROM_Checksum_Test
| Line card
| DMT
|
02.03
| Access_Card_EEPROM_Checksum_Test
| Access card
| DMT
|
02.04
| Access_Card_OEM_EEPROM_Checksum_Test
| Access card
| DMT
|
03
| CP_DRAM_Tests
|
|
|
03.01
| CP_to_DRAM_AddrBus_Indep_Test
| Line card
| FXM
|
03.02
| CP_to_DRAM_AddrBus_Walking_1s_Test
| Line card
| FDM
|
03.03
| CP_to_DRAM_AddrBus_Walking_0s_Test
| Line card
| FDM
|
03.04
| CP_to_DRAM_DataBus_WalkingBit_Test
| Line card
| FXM
|
03.05
| CP_to_DRAM_StuckBit_Memory_Test
| Line card
| FDM
|
03.06
| CP_to_DRAM_RamData_Pattern_Test
| Line card
| FDM
|
03.07
| CP_to_DRAM_Marching_1s_Test
| Line card
| FXM
|
03.08
| CP_to_DRAM_Refresh_Test
| Line card
| FXM
|
04
| CP_Parity_Test
| Line card
| FXM
|
05
| CP_Parity_Buffer_Test
| Line card
| FXM
|
06
| CP_Parity_DRAM_Test
| Line card
| FDM
|
07
| CP_PDBL_SRAM_Tests
|
|
|
07.01
| CP_to_PDBL_SRAM_AddrBus_Indep_Test
| Line card
| FXM
|
07.02
| CP_to_PDBL_SRAM_AddrBus_Walking_1s_Test
| Line card
| FDM
|
07.03
| CP_to_PDBL_SRAM_AddrBus_Walking_0s_Test
| Line card
| FDM
|
07.04
| CP_to_PDBL_SRAM_DataBus_WalkingBit_Test
| Line card
| FXM
|
07.05
| CP_to_PDBL_SRAM_StuckBit_Memory_Test
| Line card
| FDM
|
07.06
| CP_to_PDBL_SRAM_RamData_Pattern_Test
| Line card
| FDM
|
07.07
| CP_to_PDBL_SRAM_Marching_1s_Test
| Line card
| FXM
|
08
| TSU_NQP_uStore_Memory_Tests
|
|
|
08.01
| NQP_uStore_AddrBus_Indep_Test
| Line card
| FXAM
|
08.02
| NQP_uStore_AddrBus_Walking_1s_Test
| Line card
| FDAM
|
08.03
| NQP_uStore_AddrBus_Walking_0s_Test
| Line card
| FDAM
|
08.04
| NQP_uStore_DataBus_WalkingBit_Test
| Line card
| FXAM
|
08.05
| NQP_uStore_StuckBit_Memory_Test
| Line card
| FDAM
|
08.06
| NQP_uStore_RamData_Pattern_Test
| Line card
| FDAM
|
08.07
| NQP_uStore_Marching_1s_Test
| Line card
| FXAM
|
09
| TSU_DQP_uStore_Memory_Tests
|
|
|
09.01
| DQP_uStore_AddrBus_Indep_Test
| Line card
| FXAM
|
09.02
| DQP_uStore_AddrBus_Walking_1s_Test
| Line card
| FDAM
|
09.03
| DQP_uStore_AddrBus_Walking_0s_Test
| Line card
| FDAM
|
09.04
| DQP_uStore_DataBus_WalkingBit_Test
| Line card
| FXAM
|
09.05
| DQP_uStore_StuckBit_Memory_Test
| Line card
| FDAM
|
09.06
| DQP_uStore_RamData_Pattern_Test
| Line card
| FDAM
|
09.07
| DQP_uStore_Marching_1s_Test
| Line card
| FXAM
|
10
| TSU_Internal_Timer_SRAM_Tests
|
|
|
10.01
| TSU_Timer_SRAM_AddrBus_Indep_Test
| Line card
| FXAM
|
10.02
| TSU_Timer_SRAM_AddrBus_Walking_1s_Test
| Line card
| FDAM
|
10.03
| TSU_Timer_SRAM_AddrBus_Walking_0s_Test
| Line card
| FDAM
|
10.04
| TSU_Timer_SRAM_DataBus_WalkingBit_Test
| Line card
| FXAM
|
10.05
| TSU_Timer_SRAM_StuckBit_Memory_Test
| Line card
| FDAM
|
10.06
| TSU_Timer_SRAM_RamData_Pattern_Test
| Line card
| FDAM
|
10.07
| TSU_Timer_SRAM_Marching_1s_Test
| Line card
| FXAM
|
11
| TSU_Internal_CellFifo_SRAM_Tests
|
|
|
11.01
| TSU_CellFifo_AddrBus_Indep_Test
| Line card
| FXAM
|
11.02
| TSU_CellFifo_AddrBus_Walking_1s_Test
| Line card
| FDAM
|
11.03
| TSU_CellFifo_AddrBus_Walking_0s_Test
| Line card
| FDAM
|
11.04
| TSU_CellFifo_DataBus_WalkingBit_Test
| Line card
| FXAM
|
11.05
| TSU_CellFifo_StuckBit_Memory_Test
| Line card
| FDAM
|
11.06
| TSU_CellFifo_RamData_Pattern_Test
| Line card
| FDAM
|
11.07
| TSU_CellFifo_Marching_1s_Test
| Line card
| FXAM
|
12
| FSU_OSMC_uStore_Memory_Tests
|
|
|
12.01
| OSMC_uStore_AddrBus_Indep_Test
| Line card
| FXAM
|
12.02
| OSMC_uStore_AddrBus_Walking_1s_Test
| Line card
| FDAM
|
12.03
| OSMC_uStore_AddrBus_Walking_0s_Test
| Line card
| FDAM
|
12.04
| OSMC_uStore_DataBus_WalkingBit_Test
| Line card
| FXAM
|
12.05
| OSMC_uStore_StuckBit_Memory_Test
| Line card
| FDAM
|
12.06
| OSMC_uStore_RamData_Pattern_Test
| Line card
| FDAM
|
12.07
| OSMC_uStore_Marching_1s_Test
| Line card
| FXAM
|
13
| FSU_ISMC_uStore_Memory_Tests
|
|
|
13.01
| ISMC_uStore_AddrBus_Indep_Test
| Line card
| FXAM
|
13.02
| ISMC_uStore_AddrBus_Walking_1s_Test
| Line card
| FDAM
|
13.03
| ISMC_uStore_AddrBus_Walking_0s_Test
| Line card
| FDAM
|
13.04
| ISMC_uStore_DataBus_WalkingBit_Test
| Line card
| FXAM
|
13.05
| ISMC_uStore_StuckBit_Memory_Test
| Line card
| FDAM
|
13.06
| ISMC_uStore_RamData_Pattern_Test
| Line card
| FDAM
|
13.07
| ISMC_uStore_Marching_1s_Test
| Line card
| FXAM
|
14
| TLU_TLP_uStore_Memory_Tests
|
|
|
14.01
| TLP_uStore_AddrBus_Indep_Test
| Line card
| FXAM
|
14.02
| TLP_uStore_AddrBus_Walking_1s_Test
| Line card
| FDAM
|
14.03
| TLP_uStore_AddrBus_Walking_0s_Test
| Line card
| FDAM
|
14.04
| TLP_uStore_DataBus_WalkingBit_Test
| Line card
| FXAM
|
14.05
| TLP_uStore_StuckBit_Memory_Test
| Line card
| FDAM
|
14.06
| TLP_uStore_RamData_Pattern_Test
| Line card
| FDAM
|
14.07
| TLP_uStore_Marching_1s_Test
| Line card
| FXAM
|
15
| TLU_RP_uStore_Memory_Tests
|
|
|
15.01
| RP_uStore_AddrBus_Indep_Test
| Line card
| FXAM
|
15.02
| RP_uStore_AddrBus_Walking_1s_Test
| Line card
| FDAM
|
15.03
| RP_uStore_AddrBus_Walking_0s_Test
| Line card
| FDAM
|
15.04
| RP_uStore_DataBus_WalkingBit_Test
| Line card
| FXAM
|
15.05
| RP_uStore_StuckBit_Memory_Test
| Line card
| FDAM
|
15.06
| RP_uStore_RamData_Pattern_Test
| Line card
| FDAM
|
15.07
| RP_uStore_Marching_1s_Test
| Line card
| FXAM
|
16
| FLU_FLP_uStore_Memory_Tests
|
|
|
16.01
| FLP_uStore_AddrBus_Indep_Test
| Line card
| FXAM
|
16.02
| FLP_uStore_AddrBus_Walking_1s_Test
| Line card
| FDAM
|
16.03
| FLP_uStore_AddrBus_Walking_0s_Test
| Line card
| FDAM
|
16.04
| FLP_uStore_DataBus_WalkingBit_Test
| Line card
| FXAM
|
16.05
| FLP_uStore_StuckBit_Memory_Test
| Line card
| FDAM
|
16.06
| FLP_uStore_RamData_Pattern_Test
| Line card
| FDAM
|
16.07
| FLP_uStore_Marching_1s_Test
| Line card
| FXAM
|
17
| FLU_ALF_uStore_Memory_Tests
|
|
|
17.01
| ALF_uStore_AddrBus_Indep_Test
| Line card
| FXAM
|
17.02
| ALF_uStore_AddrBus_Walking_1s_Test
| Line card
| FDAM
|
17.03
| ALF_uStore_AddrBus_Walking_0s_Test
| Line card
| FDAM
|
17.04
| ALF_uStore_DataBus_WalkingBit_Test
| Line card
| FXAM
|
17.05
| ALF_uStore_StuckBit_Memory_Test
| Line card
| FDAM
|
17.06
| ALF_uStore_RamData_Pattern_Test
| Line card
| FDAM
|
17.07
| ALF_uStore_Marching_1s_Test
| Line card
| FXAM
|
18
| TSU_Register_Walking_1s_and_0s_Test
| Line card
| FDA
|
19
| FSU_Register_Walking_1s_and_0s_Test
| Line card
| FDA
|
20
| TLU_Register_Walking_1s_and_0s_Test
| Line card
| FDA
|
21
| FLU_Register_Walking_1s_and_0s_Test
| Line card
| FDA
|
22
| TSU_uDiagnostic_Tests
|
|
|
22.01
| TSU_Generic_Tests
| Line card
| DA
|
22.02
| TSU_NQP_External_Tests
| Line card
| DA
|
22.03
| TSU_NQP_Cell_Buffer_Tests
| Line card
| DAM
|
22.04
| TSU_NQP_Control_RAM_Tests
| Line card
| DAM
|
22.05
| TSU_NQP_ScratchPad_Tests
| Line card
| DAM
|
22.06
| TSU_NQP_PDBS_Tests
| Line card
| DA
|
22.07
| TSU_NQP_Miscellaneous_Tests
| Line card
| DA
|
22.08
| TSU_DQP_External_Tests
| Line card
| DA
|
22.09
| TSU_DQP_Cell_Buffer_Tests
| Line card
| DAM
|
22.10
| TSU_DQP_Control_RAM_Tests
| Line card
| DAM
|
22.11
| TSU_DQP_ScratchPad_Tests
| Line card
| DAM
|
22.12
| TSU_NQP_RamTests
| Line card
| AM
|
22.13
| TSU_DQP_RamTests
| Line card
| AM
|
23
| FSU_uDiagnostic_Tests
|
|
|
23.01
| FSU_Generic_Tests
| Line card
| DA
|
23.02
| FSU_ISMC_External_Tests
| Line card
| DA
|
23.03
| FSU_ISMC_IRAM_Tests
| Line card
| DAM
|
23.04
| FSU_ISMC_Miscellaneous_Tests
| Line card
| DA
|
23.05
| FSU_ISMC_LRIC_Tests
| Line card
| DA
|
23.06
| FSU_OSMC_External_Tests
| Line card
| DA
|
23.07
| FSU_OSMC_IRAM_Tests
| Line card
| DAM
|
23.08
| FSU_OSMC_Miscellaneous_Tests
| Line card
| DA
|
23.09
| FSU_OSMC_LRIC_Tests
| Line card
| DA
|
23.10
| FSU_OSMC_CRIC_Tests
| Line card
| DA
|
23.11
| FSU_OSMC_PDBS_Tests
| Line card
| DA
|
23.12
| FSU_OSMC_Priority_Encoder_Tests
| Line card
| DA
|
23.13
| FSU_ISMC_RamTests
| Line card
| AM
|
23.14
| FSU_OSMC_RamTests
| Line card
| AM
|
24
| TLU_uDiagnostic_Tests
|
|
|
24.01
| TLU_Generic_Tests
| Line card
| DA
|
24.02
| TLU_RP_Cell_Buffer_Tests
| Line card
| DAM
|
24.03
| TLU_RP_Miscellaneous_Tests
| Line card
| DA
|
24.04
| TLU_RP_XRI_Tests
| Line card
| DA
|
24.05
| TLU_TLP_XRAM_Tests
| Line card
| DAM
|
24.06
| TLU_TLP_Miscellaneous_Tests
| Line card
| DA
|
24.07
| TLU_TLP_PDBL_Tests
| Line card
| DA
|
24.08
| TLU_RP_RamTests
| Line card
| AM
|
24.09
| TLU_TLP_RamTests
| Line card
| AM
|
25
| FLU_uDiagnostic_Tests
|
|
|
25.01
| FLU_Generic_Tests
| Line card
| DA
|
25.02
| FLU_FLP_External_Tests
| Line card
| DA
|
25.03
| FLU_FLP_XRAM_Tests
| Line card
| DAM
|
25.04
| FLU_FLP_PDBL_Tests
| Line card
| DA
|
25.05
| FLU_ALF_External_Tests
| Line card
| DA
|
25.06
| FLU_ALF_RamTests
| Line card
| AM
|
26
| FSU_RealTimeClock_Test
| Line card
| FXA
|
27
| FSU_IntervalTimer_Test
| Line card
| FXA
|
28
| TLU_HoldoffTimer_Test
| Line card
| FDA
|
29
| TCS_NMI_Test
| Line card
| DT
|
30
| TSU_Internal_ScratchPad_SRAM_Tests
|
|
|
30.01
| TSU_SPAD_SRAM_AddrBus_Indep_Test
| Line card
| FXAM
|
30.02
| TSU_SPAD_SRAM_AddrBus_Walking_1s_Test
| Line card
| FDAM
|
30.03
| TSU_SPAD_SRAM_AddrBus_Walking_0s_Test
| Line card
| FDAM
|
30.04
| TSU_SPAD_SRAM_DataBus_WalkingBit_Test
| Line card
| FXAM
|
30.05
| TSU_SPAD_SRAM_StuckBit_Memory_Test
| Line card
| FDAM
|
30.06
| TSU_SPAD_SRAM_RamData_Pattern_Test
| Line card
| FDAM
|
30.07
| TSU_SPAD_SRAM_Marching_1s_Test
| Line card
| FXAM
|
31
| TSU_External_CellBuffer_DRAM_Tests
|
|
|
31.01
| TSU_CBuf_DRAM_AddrBus_Indep_Test
| Line card
| FXM
|
31.02
| TSU_CBuf_DRAM_AddrBus_Walking_1s_Test
| Line card
| FDM
|
31.03
| TSU_CBuf_DRAM_AddrBus_Walking_0s_Test
| Line card
| FDM
|
31.04
| TSU_CBuf_DRAM_DataBus_WalkingBit_Test
| Line card
| FXM
|
31.05
| TSU_CBuf_DRAM_StuckBit_Memory_Test
| Line card
| FDM
|
31.06
| TSU_CBuf_DRAM_RamData_Pattern_Test
| Line card
| FDM
|
31.07
| TSU_CBuf_DRAM_Marching_1s_Test
| Line card
| FXM
|
32
| TSU_External_Control_DRAM_Tests
|
|
|
32.01
| TSU_Ctrl_DRAM_AddrBus_Indep_Test
| Line card
| FXM
|
32.02
| TSU_Ctrl_DRAM_AddrBus_Walking_1s_Test
| Line card
| FDM
|
32.03
| TSU_Ctrl_DRAM_AddrBus_Walking_0s_Test
| Line card
| FDM
|
32.04
| TSU_Ctrl_DRAM_DataBus_WalkingBit_Test
| Line card
| FXM
|
32.05
| TSU_Ctrl_DRAM_StuckBit_Memory_Test
| Line card
| FDM
|
32.06
| TSU_Ctrl_DRAM_RamData_Pattern_Test
| Line card
| FDM
|
32.07
| TSU_Ctrl_DRAM_Marching_1s_Test
| Line card
| FXM
|
33
| FSU_Internal_SRAM_Tests
|
|
|
33.01
| FSU_Int_SRAM_AddrBus_Indep_Test
| Line card
| FXAM
|
33.02
| FSU_Int_SRAM_AddrBus_Walking_1s_Test
| Line card
| FDAM
|
33.03
| FSU_Int_SRAM_AddrBus_Walking_0s_Test
| Line card
| FDAM
|
33.04
| FSU_Int_SRAM_DataBus_WalkingBit_Test
| Line card
| FXAM
|
33.05
| FSU_Int_SRAM_StuckBit_Memory_Test
| Line card
| FDAM
|
33.06
| FSU_Int_SRAM_RamData_Pattern_Test
| Line card
| FDAM
|
33.07
| FSU_Int_SRAM_Marching_1s_Test
| Line card
| FXAM
|
34
| FSU_External_LRIC_SRAM_Tests
|
|
|
34.01
| FSU_LRIC_SRAM_AddrBus_Indep_Test
| Line card
| FXM
|
34.02
| FSU_LRIC_SRAM_AddrBus_Walking_1s_Test
| Line card
| FDM
|
34.03
| FSU_LRIC_SRAM_AddrBus_Walking_0s_Test
| Line card
| FDM
|
34.04
| FSU_LRIC_SRAM_DataBus_WalkingBit_Test
| Line card
| FXM
|
34.05
| FSU_LRIC_SRAM_StuckBit_Memory_Test
| Line card
| FDM
|
34.06
| FSU_LRIC_SRAM_RamData_Pattern_Test
| Line card
| FDM
|
34.07
| FSU_LRIC_SRAM_Marching_1s_Test
| Line card
| FXM
|
35
| FSU_External_CRIC_DRAM_Tests
|
|
|
35.01
| FSU_CRIC_DRAM_AddrBus_Indep_Test
| Line card
| FXM
|
35.02
| FSU_CRIC_DRAM_AddrBus_Walking_1s_Test
| Line card
| FDM
|
35.03
| FSU_CRIC_DRAM_AddrBus_Walking_0s_Test
| Line card
| FDM
|
35.04
| FSU_CRIC_DRAM_DataBus_WalkingBit_Test
| Line card
| FXM
|
35.05
| FSU_CRIC_DRAM_StuckBit_Memory_Test
| Line card
| FDM
|
35.06
| FSU_CRIC_DRAM_RamData_Pattern_Test
| Line card
| FDM
|
35.07
| FSU_CRIC_DRAM_Marching_1s_Test
| Line card
| FXM
|
36
| TLU_External_DRAM_Tests
|
|
|
36.01
| TLU_Ext_DRAM_AddrBus_Indep_Test
| Line card
| FXM
|
36.02
| TLU_Ext_DRAM_AddrBus_Walking_1s_Test
| Line card
| FDM
|
36.03
| TLU_Ext_DRAM_AddrBus_Walking_0s_Test
| Line card
| FDM
|
36.04
| TLU_Ext_DRAM_DataBus_WalkingBit_Test
| Line card
| FXM
|
36.05
| TLU_Ext_DRAM_StuckBit_Memory_Test
| Line card
| FDM
|
36.06
| TLU_Ext_DRAM_RamData_Pattern_Test
| Line card
| FDM
|
36.07
| TLU_Ext_DRAM_Marching_1s_Test
| Line card
| FXM
|
37
| FLU_External_ParseGraph_SRAM_Tests
|
|
|
37.01
| FLU_Parse_SRAM_AddrBus_Indep_Test
| Line card
| FXM
|
37.02
| FLU_Parse_DRAM_AddrBus_Walking_1s_Test
| Line card
| FDM
|
37.03
| FLU_Parse_DRAM_AddrBus_Walking_0s_Test
| Line card
| FDM
|
37.04
| FLU_Parse_DRAM_DataBus_WalkingBit_Test
| Line card
| FXM
|
37.05
| FLU_Parse_DRAM_StuckBit_Memory_Test
| Line card
| FDM
|
37.06
| FLU_Parse_DRAM_RamData_Pattern_Test
| Line card
| FDM
|
37.07
| FLU_Parse_DRAM_Marching_1s_Test
| Line card
| FXM
|
38
| FLU_External_Protocol_DRAM_Tests
|
|
|
38.01
| FLU_Proto_DRAM_AddrBus_Indep_Test
| Line card
| FXM
|
38.02
| FLU_Proto_DRAM_AddrBus_Walking_1s_Test
| Line card
| FDM
|
38.03
| FLU_Proto_DRAM_AddrBus_Walking_0s_Test
| Line card
| FDM
|
38.04
| FLU_Proto_DRAM_DataBus_WalkingBit_Test
| Line card
| FXM
|
38.05
| FLU_Proto_DRAM_StuckBit_Memory_Test
| Line card
| FDM
|
38.06
| FLU_Proto_DRAM_RamData_Pattern_Test
| Line card
| FDM
|
38.07
| FLU_Proto_DRAM_Marching_1s_Test
| Line card
| FXM
|
39
| TSU_Functional_Register_Tests
|
|
|
39.01
| TSU_NQP_Interrupt_test
| Line card
| FDA
|
39.02
| TSU_DQP_Interrupt_test
| Line card
| FDA
|
39.03
| TSU_CBUF_Error_Interrupt_test
| Line card
| FDA
|
39.04
| TSU_CRAM_Error_Interrupt_test
| Line card
| FDA
|
39.05
| TSU_PDBI_Error_Interrupt_test
| Line card
| FDA
|
39.06
| TSU_Force_NQP_Trap_test
| Line card
| FDA
|
39.07
| TSU_Force_DQP_Trap_test
| Line card
| FDA
|
40
| FSU_Functional_Register_Tests
|
|
|
40.01
| FSU_ISMC_Interrupt_test
| Line card
| FDA
|
40.02
| FSU_OSMC_Interrupt_test
| Line card
| FDA
|
40.03
| FSU_IVAL_Interrupt_test
| Line card
| FDA
|
40.04
| FSU_PDBI_Error_Interrupt_test
| Line card
| FDA
|
40.05
| FSU_TRAP_Error_Interrupt_test
| Line card
| FDA
|
40.06
| FSU_CAVL_Interrupt_test
| Line card
| FDA
|
40.07
| FSU_Force_OSMC_Trap_test
| Line card
| FDA
|
40.08
| FSU_Force_ISMC_Trap_test
| Line card
| FDA
|
41
| TLU_Functional_Register_Tests
|
|
|
41.01
| TLU_TLP_Interrupt_Test
| Line card
| FDA
|
41.02
| TLU_RP_Interrupt_Test
| Line card
| FDA
|
41.03
| TLU_PDBI_Interrupt_Test
| Line card
| FDA
|
41.04
| TLU_XRAM_Parity_Interrupt_Test
| Line card
| FDA
|
41.05
| TLU_TLP_Trap_Interrupt_Test
| Line card
| FDA
|
41.06
| TLU_RP_Trap_Interrupt_Test
| Line card
| FDA
|
41.07
| TLU_XRAM_Parity_Trap_Interrupt_Test
| Line card
| FDA
|
42
| FLU_Functional_Register_Tests
|
|
|
42.01
| FLU_FLP_Interrupt_Test
| Line card
| FDA
|
42.02
| FLU_ALF_Interrupt_Test
| Line card
| FDA
|
42.03
| FLU_PDBI_Interrupt_Test
| Line card
| FDA
|
42.04
| FLU_PMEM_Parity_Interrupt_Test
| Line card
| FDA
|
42.05
| FLU_FLP_Trap_Interrupt_Test
| Line card
| FDA
|
42.06
| FLU_ALF_Trap_Interrupt_Test
| Line card
| FDA
|
42.07
| FLU_PMEM_Parity_Trap_Interrupt_Test
| Line card
| FDA
|
43
| TSU_FSU_SWA_External_Lpbk_Test
| Line card
| FSA
|
44
| TSU_FSU_SWA_Internal_Lpbk_A_Test
| Line card
| FDA
|
45
| TSU_FSU_SWA_Internal_Lpbk_B_Test
| Line card
| FDA
|
46
| TSU_FSU_SWB_External_Lpbk_Test
| Line card
| FSA
|
47
| TSU_FSU_SWB_Internal_Lpbk_B_Test
| Line card
| FDA
|
48
| TSU_FSU_SWB_Internal_Lpbk_A_Test
| Line card
| FDA
|
49
| TSU_FSU_MultiCast_Internal_Lpbk_Test
| Line card
| FDA
|
50
| TSU_FSU_Smoothing_Internal_Lpbk_Test
| Line card
| FDA
|
51
| TSU_FSU_RATO_Internal_Lpbk_Test
| Line card
| FDA
|
52
| TSU_TLU_Internal_Lpbk_Test
| Line card
| FDA
|
53
| FLU_FSU_Internal_Lpbk_Test
| Line card
| FDA
|
54
| FLU_TLU_Internal_Lpbk_Test
| Line card
| FDA
|
55
| FDDI_Access_Card_Tests
|
|
|
55.01
| FDDI_CSR_Register_Test
| Access card
| FD
|
55.02
| CAM_Walking_Bit_Test
| Access card
| FD
|
55.03
| FDDI_CAM_Unique_Data_Test
| Access card
| FD
|
55.04
| FDDI_CAM_Address_Data_Test
| Access card
| FD
|
55.05
| FDDI_CAM_Pattern_Data_Test
| Access card
| FD
|
55.06
| FDDI_MAC_EPROM_Checksum_Test
| Access card
| FD
|
55.07
| FDDI_Register_Test
| Access card
| FD
|
55.08
| FDDI_MAC_Loop_Test
| Access card
| FD
|
55.09
| FDDI_LM_Loop_Test
| Access card
| FD
|
55.10
| FDDI_EB_Loop_Test
| Access card
| FD
|
55.11
| FDDI_FCG_Loop_Test
| Access card
| FD
|
55.12
| FDDI_Loopback_Test
| Access card
| FL
|
55.13
| FDDI_CAM_Logic_Test
| Access card
| FD
|
55.14
| TSU_FDDI_Loopback_Test
| Access card
| FDA
|
55.15
| FLU_FDDI_Loopback_Test
| Access card
| FDA
|
55.16
| FLU_FDDI_Loopback_Test#1
| Access card
| FDA
|
55.17
| FDDI_Interrupt_Test
| Access card
| FD
|
55.18
| CAM_Interrupt_Test
| Access card
| FD
|
55
| Ethernet_Access_Card_Tests
|
|
|
55.01
| Ethernet_CSR_Reg_Test
| Access card
| FD
|
55.02
| Ethernet_Voltage_Test
| Access card
| FD
|
55.03
| Ethernet_MAC_EPROM_Checksum_Test
| Access card
| FD
|
55.04
| Ethernet_NOP_Test
| Access card
| FD
|
55.05
| Ethernet_Self_Test
| Access card
| FD
|
55.06
| Ethernet_interrupt_test
| Access card
| FD
|
55.07
| Ethernet_Int_Loopback_Test
| Access card
| FD
|
55.08
| Ethernet_XCVR_Loopback_Test
| Access card
| FD
|
55.09
| Ethernet_AUI_Loopback_Test
| Access card
| FL
|
55.10
| Ethernet_Bus_Arbitration_Test
| Access card
| FD
|
55.11
| Ethernet_Bus_Internal_Test
| Access card
| FD
|
55.12
| Ethernet_Bus_External_Test
| Access card
| FL
|
55.13
| Ethernet_XC_I_Loopback_Test
| Access card
| FD
|
55.14
| Ethernet_XC_X_Loopback_Test
| Access card
| FD
|
55.15
| Ethernet_XC_E_Loopback_Test
| Access card
| FL
|
55
| Fiber_Ethernet_Access_Card_Tests
| Access card
| FD
|
55.01
| Fiber_Ethernet_CSR_Reg_Test
| Access card
| FD
|
55.02
| Fiber_Ethernet_Voltage_Test
| Access card
| FD
|
55.03
| Fiber_Ethernet_MAC_EPROM_Checksum_Test
| Access card
| FD
|
55.04
| Fiber_Ethernet_NOP_Test
| Access card
| FD
|
55.05
| Fiber_Ethernet_Self_Test
| Access card
| FD
|
55.06
| Fiber_Ethernet_Int_Loopback_Test
| Access card
| FD
|
55.07
| Fiber_Ethernet_XCVR_Loopback_Test
| Access card
| FD
|
55.08
| Fiber_Ethernet_Bus_Arbitration_Test
| Access card
| FD
|
55.09
| Fiber_Ethernet_Bus_Internal_Test
| Access card
| FD
|
55.10
| Fiber_Ethernet_interrupt_test
| Access card
| FD
|
55.11
| Fiber_Ethernet_XC_I_Loopback_Test
| Access card
| FD
|
55.12
| Fiber_Ethernet_XC_X_Loopback_Test
| Access card
| FD
|
55.13
| Fiber_Ethernet_XC_E_Loopback_Test
| Access card
| FL
|
55
| Serial_Access_Card_Tests
|
|
|
55.01
| Serial_CSR_Reg_Test
| Access card
| FD
|
55.02
| Serial_Self_Test
| Access card
| FD
|
55.03
| Serial_Int_Serial_Lpbk_Test(64 bytes)
| Access card
| FD
|
55.04
| Serial_Int_Intrlv_Lpbk_Test(64 bytes)
| Access card
| FD
|
55.05
| Serial_Ext_Intrlv_Lpbk_Test(64 bytes)
| Access card
| FL
|
55.06
| Serial_Int_Intrlv_Lpbk_Test(1520 bytes)
| Access card
| FD
|
55.07
| Serial_Ext_Serial_Lpbk_Test(1520 bytes)
| Access card
| FL
|
55.08
| Serial_V35_External_Lpbk_Test
| Access card
| FL
|
55.09
| Serial_RS449_External_Lpbk_Test
| Access card
| FL
|
55.10
| Serial_Bus_Arbitration_Test
| Access card
| FD
|
55.11
| Serial_Octart_Register_Test
| Access card
| FD
|
55.12
| Serial_Octart_Int_Loopback_Test
| Access card
| FD
|
55.13
| Serial_Octart_Ext_Loopback_Test
| Access card
| FL
|
55.14
| Serial_Clock_Measure_Test (external)
| Access card
| FL
|
55.15
| Serial_Internal_Loopback_Chain_Test
| Access card
| FDA
|
55.16
| Serial_X21_Self_Clocking_Ext_Lpbk_Test
| Access card
| FD
|
55.17
| Serial_MAC_EPROM_Checksum_Test
| Access card
| FD
|
55
| CEM_Access_Card_Tests
|
|
|
55.01
| CEMAC_Serial_EEPROM_Test
| Access card
| FD
|
55.02
| CEMAC_Voltage_Sensor_Test
| Access card
| FD
|
55.03
| CEMAC_Temperature_Sensor_Test
| Access card
| FD
|
55.04
| CEMAC_Main_PLD_Registers_Test
| Access card
| FD
|
55.05
| CEMAC_Pre_Port_PLD_CSR_Test
| Access card
| FD
|
55.06
| CEMAC_Global_Pre_Port_PLD_CSR_Test
| Access card
| FD
|
55.07
| CEMAC_Per_Port_Data_Buffer_Flag_Test
| Access card
| FD
|
55.08
| CEMAC_Per_Port_Residual_Time_Stamp_Test
| Access card
| FD
|
55.09
| CEMAC_Per_Port_Receive_Clock_Test
| Access card
| FD
|
55.10
| CEMAC_Nettime_PLL_SWA_Test
| Access card
| N
|
55.11
| CEMAC_Nettime_PLL_SWB_Test
| Access card
| N
|
55.12
| CEMAC_Nettime_PLL_SWA_SWB_Test
| Access card
| N
|
55.13
| CEMAC_Per_Port_External_Loopback_Test
| Access card
| FL
|
55.14
| CEMAC_Multi_Ports_External_Loopback_Test
| Access card
| FL
|
55.15
| CEMAC_FluTlu_Lpkb_Using_ADAPTIVE_CLOCK
| Access card
| FD
|
55.16
| CEMAC_FluTlu_Lpkb_Using_SRTS
| Access card
| FD
|
55.17
| CEMAC_FluTlu_Lpkb_Using_SYNC_CLOCK
| Access card
| FD
|
No.
| Name
| Card
| Notes
|
---|
01
| CP_Flash_Checksum_Test
| Line card
| FDM
|
02
| mc68340_Chan1_DMA_DRAM_to_SHMEM_Test
| Line card
| FD
|
03
| mc68340_Chan2_DMA_DRAM_to_SHMEM_Test
| Line card
| FD
|
04
| mc68340_Timer1_Test
| Line card
| FD
|
05
| mc68340_Timer2_Test
| Line card
| FD
|
06
| mc68340_UART_A_Internal_Loopback_Test
| Line card
| FD
|
07
| mc68340_UART_B_Internal_Loopback_Test
| Line card
| FD
|
08
| mc68340_UART_B_External_Loopback_Tst(L)
| Line card
| FL
|
09
| CP_to_DRAM_AddrBus_Indep_Test
| Line card
| FXM
|
10
| CP_to_DRAM_AddrBus_Walking_1s_Test
| Line card
| FDM
|
11
| CP_to_DRAM_AddrBus_Walking_0s_Test
| Line card
| FDM
|
12
| CP_to_DRAM_DataBus_WalkingBit_Test
| Line card
| FDM
|
13
| CP_to_DRAM_StuckBit_Memory_Test
| Line card
| FDM
|
14
| CP_to_DRAM_RamData_Pattern_Test
| Line card
| FDM
|
15
| CP_to_DRAM_Marching_1s_Test
| Line card
| FXM
|
16
| CP_to_DRAM_Refresh_Test
| Line card
| FXM
|
17
| CP_to_SharedMem_AddrBus_Indep_Test
| Line card
| FXM
|
18
| CP_to_SharedMem_AddrBus_Walking_1s_Test
| Line card
| FDM
|
19
| CP_to_SharedMem_AddrBus_Walking_0s_Test
| Line card
| FDM
|
20
| CP_to_SharedMem_DataBus_WalkingBit_Test
| Line card
| FDM
|
21
| CP_to_SharedMem_StuckBit_Memory_Test
| Line card
| FDM
|
22
| CP_to_SharedMem_RamData_Pattern_Test
| Line card
| FDM
|
23
| CP_to_SharedMem_Marching_1s_Test
| Line card
| FXM
|
24
| CP_to_SharedMem_Refresh_Test
| Line card
| FXM
|
25
| CP_to_SharedMem_Alignment_Test
| Line card
| FDM
|
26
| CP_DRAM_Parity_Test
| Line card
| FDM
|
27
| CP_SharedMem_Parity_Test
| Line card
| FDM
|
28
| TCS_340_DRAM_Test
| Line card
| FDMT
|
29
| CP_to_DRE_Mem_AddrBus_Indep_Test
| Line card
| FXM
|
30
| CP_to_DRE_Mem_AddrBus_Walking_1s_Test
| Line card
| FDM
|
31
| CP_to_DRE_Mem_AddrBus_Walking_0s_Test
| Line card
| FDM
|
32
| CP_to_DRE_Mem_DataBus_WalkingBit_Test
| Line card
| FDM
|
33
| CP_to_DRE_Mem_StuckBit_Memory_Test
| Line card
| FDM
|
34
| CP_to_DRE_Mem_RamData_Pattern_Test
| Line card
| FDM
|
35
| CP_to_DRE_Mem_Marching_1s_Test
| Line card
| FXM
|
36
| CP_to_DRE_Mem_Alignment_Test
| Line card
| FDM
|
37
| PP_to_LocalMem_AddrBus_Walking_1s_Test
| Line card
| FDM
|
38
| PP_to_LocalMem_AddrBus_Walking_0s_Test
| Line card
| FDM
|
39
| PP_to_LocalMem_DataBus_WalkingBit_Test
| Line card
| FDM
|
40
| PP_to_LocalMem_RamData_Pattern_Test
| Line card
| FDM
|
41
| CP_LineChip_Internal_Register_Test
| Access card
| FD
|
42
| CP_LineChip_External_Register_Test
| Access card
| FD
|
43
| CP_LineChip_Internal_Register_Test
| Access card
| FL
|
44
| PaddleCard_Octart_Register_Test
| Access card
| FD
|
45
| PaddleCard_Octart_Internal_Lpbk_Test
| Access card
| FD
|
46
| PaddleCard_Octart_External_Lpbk_Test(L)
| Access card
| FL
|
47
| PaddleCard_Octart_Interrupt_Test
| Access card
| FD
|
48
| PaddleCard_Modem_Signals_Test
| Access card
| FD
|
49
| PaddleCard_Internal_Clock_Monitor_Test
| Access card
| FD
|
50
| PaddleCard_Extern_Clock_Monitor_Test(L)
| Access card
| FL
|
51
| Serial_Eprom_Write_Read_Test
| Access card
| FDT
|
52
| CP_RealTime_Clock_Test
| Line card
| FD
|
53
| CP_CSR_A_Register_Test
| Line card
| FD
|
54
| CP_CSR_B_Register_Test
| Line card
| FD
|
55
| CP_CSR_C_Register_Test
| Line card
| FD
|
56
| PP_to_LocalMem_AddrBus_Indep_Test
| Line card
| FXM
|
57
| CP_to_SharedMem_AddrBus_Walking_1s_Test
| Line card
| FDM
|
58
| PP_to_LocalMem_AddrBus_Walking_0s_Test
| Line card
| FDM
|
59
| PP_to_LocalMem_DataBus_WalkingBit_Test
| Line card
| FDM
|
60
| PP_to_LocalMem_StuckBit_Memory_Test
| Line card
| FDM
|
61
| PP_to_LocalMem_RamData_Pattern_Test
| Line card
| FDM
|
62
| PP_to_LocalMem_Marching_1s_Test
| Line card
| FXM
|
63
| CP_to_SharedMem_AddrBus_Indep_Test
| Line card
| FXM
|
64
| PP_to_SharedMem_AddrBus_Walking_1s_Test
| Line card
| FDM
|
65
| PP_to_SharedMem_AddrBus_Walking_0s_Test
| Line card
| FDM
|
66
| PP_to_SharedMem_DataBus_WalkingBit_Test
| Line card
| FDM
|
67
| PP_to_SharedMem_StuckBit_Memory_Test
| Line card
| FDM
|
68
| PP_to_SharedMem_RamData_Pattern_Test
| Line card
| FDM
|
69
| PP_to_SharedMem_Marching_1s_Test
| Line card
| FXM
|
70
| PP_to_SharedMem_Read_Modify_Write_Test
| Line card
| FDM
|
71
| PP_to_DRE_Mem_AddrBus_Indep_Test
| Line card
| FXM
|
72
| PP_to_DRE_Mem_AddrBus_Walking_1s_Test
| Line card
| FDM
|
73
| PP_to_DRE_Mem_AddrBus_Walking_0s_Test
| Line card
| FDM
|
74
| PP_to_DRE_Mem_DataBus_WalkingBit_Test
| Line card
| FDM
|
75
| PP_to_DRE_Mem_StuckBit_Memory_Test
| Line card
| FDM
|
76
| PP_to_DRE_Mem_RamData_Pattern_Test
| Line card
| FDM
|
77
| PP_to_DRE_Mem_Marching_1s_Test
| Line card
| FXM
|
78
| PP_Memory_Alignment_Test
| Line card
| FDM
|
79
| PP_LineChip_Internal_Register_Test
| Access card
| FD
|
80
| PP_RealTime_Clock_Test
| Line card
| FD
|
81
| CP_to_PP_Interrupt_Test
| Line card
| FD
|
82
| DRE_and_Shared_Memory_Arbitration_Test
| Line card
| FDM
|
83
| FSU_BIU_Test
| Line card
| FD
|
84
| FSU_BlinkLED_Test
| Line card
| FD
|
85
| FSU_PCTL_Register_Ripple_Test
| Line card
| FD
|
86
| FSU_PCTL_SRamData_Test
| Line card
| FD
|
87
| FSU_KH_Complete_Test
| Line card
| FD
|
88
| PCP_BIU_Test
| Line card
| FD
|
89
| PCP_BlinkLED_Test
| Line card
| FD
|
90
| PCP_DRAM_Test
| Line card
| FD
|
91
| PCP_VRAM_Test
| Line card
| FD
|
92
| PCP_SL_DMA_Reg_DMA_RW_Test
| Line card
| FD
|
93
| PCP_SL_DRAM_Test
| Line card
| FD
|
94
| PCP_SL_VRAM_Test
| Line card
| FD
|
95
| PCP_SL_Enqueue_Join_Test
| Line card
| FD
|
96
| PCP_SL_DRAM_VRAM_Test
| Line card
| FD
|
97
| PCP_SL_Cell_Chopper_Test
| Line card
| FD
|
98
| PCP_SL_Enqueuing_HW_Test
| Line card
| FD
|
99
| PCP_SL_Extensive_DMA_Test
| Line card
| FD
|
100
| PCP_SL_CMP_Contention_Test
| Line card
| FD
|
101
| CMP_DRAM_Test
| Line card
| FD
|
102
| CMP_SL_DRAM_Test
| Line card
| FD
|
103
| CMP_SL_Dequeue_Cell_Test
| Line card
| FD
|
104
| CMP_SL_Push_Cell_SOB_Test
| Line card
| FD
|
105
| DataGram_SingleCast__Internal_Lpbk_Test
| Line card
| FD
|
106
| DataGram_MultiCast___Internal_Lpbk_Test
| Line card
| FD
|
107
| DataGram_Metered_____Internal_Lpbk_Test
| Line card
| FD
|
108
| DataGram_MtCast_Metd_Internal_Lpbk_Test
| Line card
| FD
|
109
| Isochronous_SinglCst_Internal_Lpbk_Test
| Line card
| FD
|
110
| Isochronous_MultiCst_Internal_Lpbk_Test
| Line card
| FD
|
111
| DataGram_SingleCast__External_Lpbk_Test
| Line card
| FS
|
112
| DataGram_MultiCast___External_Lpbk_Test
| Line card
| FS
|
113
| DataGram_Metered_____External_Lpbk_Test
| Line card
| FS
|
114
| DataGram_MtCast_Metd_External_Lpbk_Test
| Line card
| FS
|
115
| Isochronous_SinglCst_External_Lpbk_Test
| Line card
| FS
|
116
| Isochronous_MultiCst_External_Lpbk_Test
| Line card
| FS
|
117
| FSU_Dropped_Cell_Test_(PIT)
| Line card
| FD
|
118
| FSU_RATO_Test_(PIT)
| Line card
| FD
|
No.
| Name
| Card
| Notes
|
---|
01
| CP_Flash_Checksum_Test
| Line card
| FDM
|
02
| mc68340_Chan1_DMA_DRAM_to_DRAM_Test
| Line card
| FD
|
03
| mc68340_Chan2_DMA_DRAM_to_DRAM_Test
| Line card
| FD
|
04
| mc68340_Timer1_Test
| Line card
| FD
|
05
| mc68340_Timer2_Test
| Line card
| FD
|
06
| mc68340_UART_A_Internal_Loopback_Test
| Line card
| FD
|
07
| mc68340_UART_B_Internal_Loopback_Test
| Line card
| FD
|
08
| CP_to_DRAM_StuckBit_Memory_Test
| Line card
| FDM
|
09
| CP_to_DRAM_DataBus_WalkingBit_Test
| Line card
| FDM
|
10
| CP_to_DRAM_AddrBus_Walking_1s_Test
| Line card
| FDM
|
11
| CP_to_DRAM_AddrBus_Walking_0s_Test
| Line card
| FDM
|
12
| CP_to_DRAM_RamData_Pattern_Test
| Line card
| FDM
|
13
| CP_to_DRAM_Refresh_Test
| Line card
| FXM
|
14
| CP_to_DRAM_AddrBus_Indep_Test
| Line card
| FXM
|
15
| CP_to_DRAM_Marching_1s_Test
| Line card
| FXM
|
16
| CP_CSR_A_Register_Test
| Line card
| FD
|
17
| CP_CSR_B_Register_Test
| Line card
| FD
|
18
| CP_CSR_C_Register_Test
| Line card
| FD
|
19
| CP_to_TSU_CntrlRAM_StuckBit_Mem_Test
| Line card
| FDM
|
20
| CP_to_TSU_CntrlRAM_DBus_WalkingBit_Test
| Line card
| FDM
|
21
| CP_to_TSU_CntrlRAM_ABus_Walking_1s_Test
| Line card
| FDM
|
22
| CP_to_TSU_CntrlRAM_ABus_Walking_0s_Test
| Line card
| FDM
|
23
| CP_to_TSU_CntrlRAM_Data_Pattern_Test
| Line card
| FDM
|
24
| CP_to_TSU_CntrlRAM_AddrBus_Indep_Test
| Line card
| FXM
|
25
| CP_to_TSU_CntrlRAM_Marching_1s_Test
| Line card
| FXM
|
26
| CP_to_CTP_PgmMem_DBus_WalkingBit_Test
| Line card
| FDM
|
27
| CP_to_CTP_PgmMem_ABus_Walking_1s_Test
| Line card
| FDM
|
28
| CP_to_CTP_PgmMem_ABus_Walking_0s_Test
| Line card
| FDM
|
29
| CP_to_CTP_PgmMem_RamData_Pattern_Test
| Line card
| FDM
|
30
| CP_to_TSU_Ctrl_FIFO_StuckBit_Mem_Test
| Line card
| FDM
|
31
| CP_to_TSU_Ctrl_FIFO_ABus_Walking_1s_Tst
| Line card
| FDM
|
32
| CP_to_TSU_Ctrl_FIFO_DBus_WalkingBit_Tst
| Line card
| FDM
|
33
| CP_to_TSU_Ctrl_FIFO_RamData_Pattern_Tst
| Line card
| FDM
|
34
| CP_to_FSU_Ctrl_FIFO_StuckBit_Mem_Test
| Line card
| FDM
|
35
| CP_to_FSU_Ctrl_FIFO_ABus_Walking_1s_Tst
| Line card
| FDM
|
36
| CP_to_FSU_Ctrl_FIFO_DBus_WalkingBit_Tst
| Line card
| FDM
|
37
| CP_to_FSU_Ctrl_FIFO_RamData_Pattern_Tst
| Line card
| FDM
|
38
| CP_to_FSU_CtrlSRAM_StuckBit_Mem_Tst
| Line card
| FDM
|
39
| CP_to_FSU_CtrlSRAM_ABus_Walking_1s_Test
| Line card
| FDM
|
40
| CP_to_FSU_CtrlSRAM_DBus_WalkingBit_Test
| Line card
| FDM
|
41
| CP_to_FSU_CtrlSRAM_RamData_Pattern_Test
| Line card
| FDM
|
42
| CTP_FifoA_StuckBit_Test
| Line card
| FDM
|
43
| CTP_FifoA_AddrBus_Walking_1s_Test
| Line card
| FDM
|
44
| CTP_FifoA_DataBus_WalkingBit_Test
| Line card
| FDM
|
45
| CTP_FifoA_RamData_Pattern_Test
| Line card
| FDM
|
46
| CTP_FifoB_StuckBit_Test
| Line card
| FDM
|
47
| CTP_FifoB_AddrBus_Walking_1s_Test
| Line card
| FDM
|
48
| CTP_FifoB_DataBus_WalkingBit_Test
| Line card
| FDM
|
49
| CTP_FifoB_RamData_Pattern_Test
| Line card
| FDM
|
50
| CTP_Control_Fifo_StuckBit_Test
| Line card
| FDM
|
51
| CTP_Control_Fifo_AddrBus_Walking_1s_Test
| Line card
| FDM
|
52
| CTP_Control_Fifo_DataBus_WalkingBit_Test
| Line card
| FDM
|
53
| CTP_Control_Fifo_RamData_Pattern_Test
| Line card
| FDM
|
54
| CTP_Control_Ram_StuckBit_Test
| Line card
| FDM
|
55
| CTP_Control_Ram_AddrBus_Walking_1s_Test
| Line card
| FDM
|
56
| CTP_Control_Ram_DataBus_WalkingBit_Test
| Line card
| FDM
|
57
| CTP_Control_Ram_RamData_Pattern_Test
| Line card
| FDM
|
58
| CTP_Cell_Buffer_StuckBit_Test
| Line card
| FDM
|
59
| CTP_Cell_Buffer_AddrBus_Walking_1s_Test
| Line card
| FDM
|
60
| CTP_Cell_Buffer_DataBus_WalkingBit_Test
| Line card
| FDM
|
61
| CTP_Cell_Buffer_RamData_Pattern_Test
| Line card
| FDM
|
62
| CP_DRAM_Parity_Test
| Line card
| FDM
|
63
| CP_RealTime_Clock_Test
| Line card
| FD
|
64
| SCastDgm_TrunkA_Fifo_Internal_Lpbk
| Line card
| FD
|
65
| SCastDgm_TrunkB_Fifo_Internal_Lpbk
| Line card
| FD
|
66
| SCastDgm_Cntrl__Fifo_Internal_Lpbk
| Line card
| FD
|
67
| MCastDgm_TrunkA_Fifo_Internal_Lpbk
| Line card
| FD
|
68
| MCastDgm_TrunkB_Fifo_Internal_Lpbk
| Line card
| FD
|
69
| MCastDgm_Cntrl__Fifo_Internal_Lpbk
| Line card
| FD
|
70
| SCastDgm_SWA_Cntrl__Fifo_External_Lpbk
| Line card
| FS
|
71
| MCastDgm_SWA_Cntrl__Fifo_External_Lpbk
| Line card
| FS
|
72
| SCastSch_SWA_Cntrl__Fifo_External_Lpbk
| Line card
| FS
|
73
| MCastSch_SWA_Cntrl__Fifo_External_Lpbk
| Line card
| FS
|
74
| SCastDgm_SWB_Cntrl__Fifo_External_Lpbk
| Line card
| FS
|
75
| MCastDgm_SWB_Cntrl__Fifo_External_Lpbk
| Line card
| FS
|
76
| SCastSch_SWB_Cntrl__Fifo_External_Lpbk
| Line card
| FS
|
77
| MCastSch_SWB_Cntrl__Fifo_External_Lpbk
| Line card
| FS
|
78
| FSU_Header_LRC_Error_Test
| Line card
| FD
|
79
| FSU_Payload_LRC_Error_Test
| Line card
| FD
|
80
| FSU_VRAM_Refresh_Test
| Line card
| FD
|
81
| PaddleCard_Control_Status_Reg_Test
| Access card
| FD
|
82
| PaddleCard_E3_Framer_Test
| Access card
| FD
|
83
| PaddleCard_Serial_Eeprom_Test
| Access card
| FDT
|
84
| PaddleCard_PLPP_Internal_Reg_Test
| Access card
| FD
|
85
| T3/E3_PLPP_TrunkA_Fifo_PLPP_Int_Lpbk
| Access card
| FD
|
86
| T3/E3_PLPP_TrunkB_Fifo_PLPP_Int_Lpbk
| Access card
| FD
|
87
| E3_only_Framer_TrunkA_Fifo_Int_Lpbk
| Access card
| FD
|
88
| E3_only_Framer_TrunkB_Fifo_Int_Lpbk
| Access card
| FD
|
89
| T3/E3_PLPP_TrunkA_Fifo_LIM/MRT_Int_Lpbk
| Access card
| FD
|
90
| T3/E3_PLPP_TrunkB_Fifo_LIM/MRT_Int_Lpbk
| Access card
| FD
|
91
| T3/E3_PLPP_TrunkA_Fifo_Relay_Int_Lpbk
| Access card
| FD
|
92
| T3/E3_PLPP_TrunkB_Fifo_Relay_Int_Lpbk
| Access card
| FD
|
93
| T3/E3_PLPP_TrunkA_Fifo_External_Lpbk
| Access card
| FL
|
94
| T3/E3_PLPP_TrunkB_Fifo_External_Lpbk
| Access card
| FL
|
95
| PaddleCard_LED_Reg_Test
| Access card
| FD
|