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This appendix lists the following diagnostic tests for the LightStream 2020 multiservice ATM switch (LS2020 switch):
To run these tests, follow the procedures in the Manufacturing Diagnostics section of the chapter entitled "Hardware Troubleshooting."
The table is divided into four columns: No. refers to the test number used with run <test#> command; Name gives a brief description of the test; Card lists the type of card affected by the test; and Notes provides additional information about each test. Use the following legend when referring to the Notes column:
| No. | Name | Card | Notes |
|---|---|---|---|
| 01 | MC68040_Core_Test | Line card | Z |
| 02 | WalkingBit_Memory_Test | Line card | FDM |
| 03 | Address_Walking_1s_Memory_Test | Line card | FDM |
| 04 | Address_Walking_0s_Memory_Test | Line card | FDM |
| 05 | StuckBit_Memory_Test | Line card | FDM |
| 06 | Refresh_Memory_Test | Line card | FXM |
| 07 | Ram_Data_Test | Line card | FDM |
| 08 | Address_Independence_Memory_Test | Line card | FXM |
| 09 | MarchingBit_Memory_Test | Line card | FXM |
| 10 | Move_16_Memory_Test | Line card | FDM |
| 11 | Ethernet_Register_Test | Line card | FD |
| 12 | Ethernet_Internal_Loopback_Test | Line card | FD |
| 13 | Ethernet_External_Loopback_Test | Line card | FL |
| 14 | Ethernet_External_Chaining | Line card | FL |
| 15 | Ethernet_CRC_Test | Line card | Z |
| 16 | BBRAM_Clock_Register_Test | Line card | FD |
| 17 | BBRAM_Clock_Read_Test | Line card | FD |
| 18 | BBRAM_Clock_Read_Write_Test | Line card | FD |
| 19 | BBRAM_Ram_Walking_1s_0s_Test | Line card | FD |
| 20 | PIT_0_Register_Test | Line card | FD |
| 21 | PIT_1_Register_Test | Line card | FD |
| 22 | PIT_0_Timer0_Test | Line card | Z |
| 23 | PIT_0_Timer1_Test | Line card | Z |
| 24 | PIT_0_Timer2_Test | Line card | Z |
| 25 | RealTime_Clock_Read_Test | Line card | FD |
| 26 | RealTime_Clock_Accuracy_Test | Line card | FD |
| 27 | RealTime_Clock_Move16_Test | Line card | FD |
| 28 | Interrupt_Controller_Register_Test | Line card | FD |
| 29 | Interrupt_Controller_Interrupt_Test | Line card | FD |
| 30 | SCC_Register_Test | Line card | FD |
| 31 | SCC_ChA_Internal_Loopback_Test | Line card | FD |
| 32 | SCC_ChB_Internal_Loopback_Test | Line card | FD |
| 33 | SCC_ChB_External_Loopback_Test | Line card | FL |
| 34 | TCS_040_DRAM_Test | Line card | FDMT |
| 35 | Bus_Timeout_Test_(BTO) | Line card | FD |
| 36 | Pattern_Parity_Test | Line card | FD |
| 37 | Late_Parity_Test | Line card | FD |
| 38 | Early_Parity_Test | Line card | FD |
| 39 | SCSI_Register_Test | Line card | FD |
| 40 | SCSI_Interrupt_Test | Line card | FD |
| 41 | SCSI_DMA_FIFO_Test | Line card | FD |
| 42 | SCSI_FIFO_Test | Line card | FD |
| 43 | Hard_Drive_Self_Test | Line card | P |
| 44 | Hard_Drive_Seek_Test | Line card | P |
| 45 | Hard_Drive_Write_Read_Test | Line card | P |
| 46 | Hard_Drive_Write_Read_Interrupt_Tst | Line card | P |
| 47 | Floppy_Drive_Self_Test | Line card | P |
| 48 | Floppy_Drive_Seek_Test | Line card | P |
| 49 | Floppy_Drive_Write_Read_Test | Line card | P |
| 50 | Paddle_Card_Serial_Eprom_Test | Access card | Z |
| 51 | SI1_Card_Serial_Eprom_Test | Line card | Z |
| 52 | Switch_Clk_Reg_Test | Line card | S |
| 53 | FSU_BIU_Test | Line card | Z |
| 54 | FSU_BlinkLED_Test | Line card | Z |
| 55 | FSU_PCTL_Register_Ripple_Test | Line card | Z |
| 56 | FSU_PCTL_SRamData_Test | Line card | Z |
| 57 | FSU_040_Interrupt_Test | Line card | Z |
| 58 | FSU_KH_Complete_Test | Line card | Z |
| 59 | PCP_BIU_Test | Line card | Z |
| 60 | PCP_BlinkLED_Test | Line card | Z |
| 61 | PCP_DRAM_Test | Line card | Z |
| 62 | PCP_VRAM_Test | Line card | Z |
| 63 | PCP_040_Interrupt_Test | Line card | Z |
| 64 | PCP_SL_DMA_Reg_DMA_RW_Test | Line card | Z |
| 65 | PCP_SL_DRAM_Test | Line card | Z |
| 66 | PCP_SL_VRAM_Test | Line card | Z |
| 67 | PCP_SL_Enqueue_Join_Test | Line card | Z |
| 68 | PCP_SL_DRAM_VRAM_Test | Line card | Z |
| 69 | PCP_SL_Cell_Chopper_Test | Line card | Z |
| 70 | PCP_SL_Enqueuing_HW_Test | Line card | Z |
| 71 | PCP_SL_Extensive_DMA_Test | Line card | Z |
| 72 | PCP_SL_CMP_Contention_Test | Line card | Z |
| 73 | PCP_DRAM_Refresh_Test | Line card | Z |
| 74 | PCP_VRAM_Refresh_Test | Line card | Z |
| 75 | CMP_DRAM_Test | Line card | Z |
| 76 | CMP_SL_DRAM_Test | Line card | Z |
| 77 | CMP_SL_Dequeue_Cell_Test | Line card | Z |
| 78 | CMP_SL_Push_Cell_SOB_Test | Line card | Z |
| 79 | Raw_Cell_Internal_Loopback_Test | Line card | FD |
| 80 | Raw_Cell_External_Loopback_Test | Line card | FS |
| 81 | Data_Gram_Internal_Loopback_Test | Line card | FD |
| 82 | Data_Gram_External_Loopback_Test | Line card | FS |
| 83 | Data_Gram_Metered_Loopback_Test | Line card | FD |
| 84 | Multi_DataGram_Metered_Loopback_Test | Line card | FD |
| 85 | Chained_Data_Gram_Loopback_Test | Line card | FD |
| 86 | Iso_Sngle_Cast_Loopback_Test | Line card | FD |
| 87 | Multi_Cast_Data_Gram_Loopback_Test | Line card | FD |
| 88 | Comp_Data_Gram_Loopback_Test | Line card | FD |
| 89 | Multi_Cast_IsoLoopback_Test | Line card | FD |
| 90 | FSU_RATO_Test | Line card | FD |
| 91 | FSU_fast_dropper_Test | Line card | FD |
| 92 | FSU_VRAM_mem_Test | Line card | FD |
| 93 | FSU_VRAM_refresh_Test | Line card | FX |
| No. | Name | Card | Notes |
|---|---|---|---|
| 01 | CP_Flash_Checksum_Test | Line card | FDM |
| 02 | EEPROM_Checksum_Tests | ||
| 02.01 | HC11_Configuration_EEPROM_Checksum_Test | Line card | DMT |
| 02.02 | HC11_Application_EEPROM_Checksum_Test | Line card | DMT |
| 02.03 | Access_Card_EEPROM_Checksum_Test | Access card | DMT |
| 02.04 | Access_Card_OEM_EEPROM_Checksum_Test | Access card | DMT |
| 03 | CP_DRAM_Tests | ||
| 03.01 | CP_to_DRAM_AddrBus_Indep_Test | Line card | FXM |
| 03.02 | CP_to_DRAM_AddrBus_Walking_1s_Test | Line card | FDM |
| 03.03 | CP_to_DRAM_AddrBus_Walking_0s_Test | Line card | FDM |
| 03.04 | CP_to_DRAM_DataBus_WalkingBit_Test | Line card | FXM |
| 03.05 | CP_to_DRAM_StuckBit_Memory_Test | Line card | FDM |
| 03.06 | CP_to_DRAM_RamData_Pattern_Test | Line card | FDM |
| 03.07 | CP_to_DRAM_Marching_1s_Test | Line card | FXM |
| 03.08 | CP_to_DRAM_Refresh_Test | Line card | FXM |
| 04 | CP_Parity_Test | Line card | FXM |
| 05 | CP_Parity_Buffer_Test | Line card | FXM |
| 06 | CP_Parity_DRAM_Test | Line card | FDM |
| 07 | TSU_NQP_uStore_Memory_Tests | ||
| 07.01 | NQP_uStore_AddrBus_Indep_Test | Line card | FXAM |
| 07.02 | NQP_uStore_AddrBus_Walking_1s_Test | Line card | FDAM |
| 07.03 | NQP_uStore_AddrBus_Walking_0s_Test | Line card | FDAM |
| 07.04 | NQP_uStore_DataBus_WalkingBit_Test | Line card | FXAM |
| 07.05 | NQP_uStore_StuckBit_Memory_Test | Line card | FDAM |
| 07.06 | NQP_uStore_RamData_Pattern_Test | Line card | FDAM |
| 07.07 | NQP_uStore_Marching_1s_Test | Line card | FXAM |
| 08 | TSU_DQP_uStore_Memory_Tests | ||
| 08.01 | DQP_uStore_AddrBus_Indep_Test | Line card | FXAM |
| 08.02 | DQP_uStore_AddrBus_Walking_1s_Test | Line card | FDAM |
| 08.03 | DQP_uStore_AddrBus_Walking_0s_Test | Line card | FDAM |
| 08.04 | DQP_uStore_DataBus_WalkingBit_Test | Line card | FXAM |
| 08.05 | DQP_uStore_StuckBit_Memory_Test | Line card | FDAM |
| 08.06 | DQP_uStore_RamData_Pattern_Test | Line card | FDAM |
| 08.07 | DQP_uStore_Marching_1s_Test | Line card | FXAM |
| 09 | TSU_Internal_Timer_SRAM_Tests | ||
| 09.01 | TSU_Timer_SRAM_AddrBus_Indep_Test | Line card | FXAM |
| 09.02 | TSU_Timer_SRAM_AddrBus_Walking_1s_Test | Line card | FDAM |
| 09.03 | TSU_Timer_SRAM_AddrBus_Walking_0s_Test | Line card | FDAM |
| 09.04 | TSU_Timer_SRAM_DataBus_WalkingBit_Test | Line card | FXAM |
| 09.05 | TSU_Timer_SRAM_StuckBit_Memory_Test | Line card | FDAM |
| 09.06 | TSU_Timer_SRAM_RamData_Pattern_Test | Line card | FDAM |
| 09.07 | TSU_Timer_SRAM_Marching_1s_Test | Line card | FXAM |
| 10 | TSU_Internal_CellFifo_SRAM_Tests | ||
| 10.01 | TSU_CellFifo_AddrBus_Indep_Test | Line card | FXAM |
| 10.02 | TSU_CellFifo_AddrBus_Walking_1s_Test | Line card | FDAM |
| 10.03 | TSU_CellFifo_AddrBus_Walking_0s_Test | Line card | FDAM |
| 10.04 | TSU_CellFifo_DataBus_WalkingBit_Test | Line card | FXAM |
| 10.05 | TSU_CellFifo_StuckBit_Memory_Test | Line card | FDAM |
| 10.06 | TSU_CellFifo_RamData_Pattern_Test | Line card | FDAM |
| 10.07 | TSU_CellFifo_Marching_1s_Test | Line card | FXAM |
| 11 | TSU_B_NQP_uStore_Memory_Tests | ||
| 11.01 | NQP_B_uStore_AddrBus_Indep_Test | Line card | FXAM |
| 11.02 | NQP_B_uStore_AddrBus_Walking_1s_Test | Line card | FDAM |
| 11.03 | NQP_B_uStore_AddrBus_Walking_0s_Test | Line card | FDAM |
| 11.04 | NQP_B_uStore_DataBus_WalkingBit_Test | Line card | FXAM |
| 11.05 | NQP_B_uStore_StuckBit_Memory_Test | Line card | FDAM |
| 11.06 | NQP_B_uStore_RamData_Pattern_Test | Line card | FDAM |
| 11.07 | NQP_B_uStore_Marching_1s_Test | Line card | FXAM |
| 12 | TSU_B_DQP_uStore_Memory_Tests | ||
| 12.01 | DQP_B_uStore_AddrBus_Indep_Test | Line card | FXAM |
| 12.02 | DQP_B_uStore_AddrBus_Walking_1s_Test | Line card | FDAM |
| 12.03 | DQP_B_uStore_AddrBus_Walking_0s_Test | Line card | FDAM |
| 12.04 | DQP_B_uStore_DataBus_WalkingBit_Test | Line card | FXAM |
| 12.05 | DQP_B_uStore_StuckBit_Memory_Test | Line card | FDAM |
| 12.06 | DQP_B_uStore_RamData_Pattern_Test | Line card | FDAM |
| 12.07 | DQP_B_uStore_Marching_1s_Test | Line card | FXAM |
| 13 | TSU_B_Internal_Timer_SRAM_Tests | ||
| 13.01 | TSU_B_Timer_SRAM_AddrBus_Indep_Test | Line card | FXAM |
| 13.02 | TSU_B_Timer_SRAM_AddrBus_Walking_1s_Test | Line card | FDAM |
| 13.03 | TSU_B_Timer_SRAM_AddrBus_Walking_0s_Test | Line card | FDAM |
| 13.04 | TSU_B_Timer_SRAM_DataBus_WalkingBit_Test | Line card | FXAM |
| 13.05 | TSU_B_Timer_SRAM_StuckBit_Memory_Test | Line card | FDAM |
| 13.06 | TSU_B_Timer_SRAM_RamData_Pattern_Test | Line card | FDAM |
| 13.07 | TSU_B_Timer_SRAM_Marching_1s_Test | Line card | FXAM |
| 14 | TSU_B_Internal_CellFifo_SRAM_Tests | ||
| 14.01 | TSU_B_CellFifo_AddrBus_Indep_Test | Line card | FXAM |
| 14.02 | TSU_B_CellFifo_AddrBus_Walking_1s_Test | Line card | FDAM |
| 14.03 | TSU_B_CellFifo_AddrBus_Walking_0s_Test | Line card | FDAM |
| 14.04 | TSU_B_CellFifo_DataBus_WalkingBit_Test | Line card | FXAM |
| 14.05 | TSU_B_CellFifo_StuckBit_Memory_Test | Line card | FDAM |
| 14.06 | TSU_B_CellFifo_RamData_Pattern_Test | Line card | FDAM |
| 14.07 | TSU_B_CellFifo_Marching_1s_Test | Line card | FXAM |
| 15 | FSU_OSMC_uStore_Memory_Tests | ||
| 15.01 | OSMC_uStore_AddrBus_Indep_Test | Line card | FXAM |
| 15.02 | OSMC_uStore_AddrBus_Walking_1s_Test | Line card | FDAM |
| 15.03 | OSMC_uStore_AddrBus_Walking_0s_Test | Line card | FDAM |
| 15.04 | OSMC_uStore_DataBus_WalkingBit_Test | Line card | FXAM |
| 15.05 | OSMC_uStore_StuckBit_Memory_Test | Line card | FDAM |
| 15.06 | OSMC_uStore_RamData_Pattern_Test | Line card | FDAM |
| 15.07 | OSMC_uStore_Marching_1s_Test | Line card | FXAM |
| 16 | FSU_ISMC_uStore_Memory_Tests | ||
| 16.01 | ISMC_uStore_AddrBus_Indep_Test | Line card | FXAM |
| 16.02 | ISMC_uStore_AddrBus_Walking_1s_Test | Line card | FDAM |
| 16.03 | ISMC_uStore_AddrBus_Walking_0s_Test | Line card | FDAM |
| 16.04 | ISMC_uStore_DataBus_WalkingBit_Test | Line card | FXAM |
| 16.05 | ISMC_uStore_StuckBit_Memory_Test | Line card | FDAM |
| 16.06 | ISMC_uStore_RamData_Pattern_Test | Line card | FDAM |
| 16.07 | ISMC_uStore_Marching_1s_Test | Line card | FXAM |
| 17 | TSU_Register_Walking_1s_and_0s_Test | Line card | FDA |
| 18 | TSU_B_Register_Walking_1s_and_0s_Test | Line card | FDA |
| 19 | FSU_Register_Walking_1s_and_0s_Test | Line card | FDA |
| 20 | TSU_uDiagnostic_Tests | ||
| 20.01 | TSU_Generic_Tests | Line card | DA |
| 20.02 | TSU_NQP_External_Tests | Line card | DA |
| 20.03 | TSU_NQP_Cell_Buffer_Tests | Line card | DAM |
| 20.04 | TSU_NQP_Control_RAM_Tests | Line card | DAM |
| 20.05 | TSU_NQP_ScratchPad_Tests | Line card | DAM |
| 20.06 | TSU_NQP_PDBS_Tests | Line card | DA |
| 20.07 | TSU_NQP_Miscellaneous_Tests | Line card | DA |
| 20.08 | TSU_DQP_External_Tests | Line card | DA |
| 20.09 | TSU_DQP_Cell_Buffer_Tests | Line card | DAM |
| 20.10 | TSU_DQP_Control_RAM_Tests | Line card | DAM |
| 20.11 | TSU_DQP_ScratchPad_Tests | Line card | DAM |
| 20.12 | TSU_NQP_RamTests | Line card | AM |
| 20.13 | TSU_DQP_RamTests | Line card | AM |
| 21 | TSU_B_uDiagnostic_Tests | ||
| 21.01 | TSU_B_Generic_Tests | Line card | DA |
| 21.02 | TSU_B_NQP_External_Tests | Line card | DA |
| 21.03 | TSU_B_NQP_Cell_Buffer_Tests | Line card | DAM |
| 21.04 | TSU_B_NQP_Control_RAM_Tests | Line card | DAM |
| 21.05 | TSU_B_NQP_ScratchPad_Tests | Line card | DAM |
| 21.06 | TSU_B_NQP_PDBS_Tests | Line card | DA |
| 21.07 | TSU_B_NQP_Miscellaneous_Tests | Line card | DA |
| 21.08 | TSU_B_DQP_External_Tests | Line card | DA |
| 21.09 | TSU_B_DQP_Cell_Buffer_Tests | Line card | DAM |
| 21.10 | TSU_B_DQP_Control_RAM_Tests | Line card | DAM |
| 21.11 | TSU_B_DQP_ScratchPad_Tests | Line card | DAM |
| 21.12 | TSU_B_NQP_RamTests | Line card | AM |
| 21.13 | TSU_B_DQP_RamTests | Line card | AM |
| 22 | FSU_uDiagnostic_Tests | ||
| 22.01 | FSU_Generic_Tests | Line card | DA |
| 22.02 | FSU_ISMC_External_Tests | Line card | DA |
| 22.03 | FSU_ISMC_IRAM_Tests | Line card | DAM |
| 22.04 | FSU_ISMC_Miscellaneous_Tests | Line card | DA |
| 22.05 | FSU_ISMC_LRIC_Tests | Line card | DA |
| 22.06 | FSU_OSMC_External_Tests | Line card | DA |
| 22.07 | FSU_OSMC_IRAM_Tests | Line card | DAM |
| 22.08 | FSU_OSMC_Miscellaneous_Tests | Line card | DA |
| 22.09 | FSU_OSMC_LRIC_Tests | Line card | DA |
| 22.10 | FSU_OSMC_CRIC_Tests | Line card | DA |
| 22.11 | FSU_OSMC_PDBS_Tests | Line card | DA |
| 22.12 | FSU_OSMC_Priority_Encoder_Tests | Line card | DA |
| 22.13 | FSU_ISMC_RamTests | Line card | AM |
| 22.14 | FSU_OSMC_RamTests | Line card | AM |
| 23 | FSU_RealTimeClock_Test | Line card | FXA |
| 24 | FSU_IntervalTimer_Test | Line card | FXA |
| 25 | TCS_NMI_Test | Line card | DT |
| 26 | TSU_Internal_ScratchPad_SRAM_Tests | ||
| 26.01 | TSU_SPAD_SRAM_AddrBus_Indep_Test | Line card | FXAM |
| 26.02 | TSU_SPAD_SRAM_AddrBus_Walking_1s_Test | Line card | FDAM |
| 26.03 | TSU_SPAD_SRAM_AddrBus_Walking_0s_Test | Line card | FDAM |
| 26.04 | TSU_SPAD_SRAM_DataBus_WalkingBit_Test | Line card | FXAM |
| 26.05 | TSU_SPAD_SRAM_StuckBit_Memory_Test | Line card | FDAM |
| 26.06 | TSU_SPAD_SRAM_RamData_Pattern_Test | Line card | FDAM |
| 26.07 | TSU_SPAD_SRAM_Marching_1s_Test | Line card | FXAM |
| 27 | TSU_External_CellBuffer_DRAM_Tests | ||
| 27.01 | TSU_CBuf_DRAM_AddrBus_Indep_Test | Line card | FXM |
| 27.02 | TSU_CBuf_DRAM_AddrBus_Walking_1s_Test | Line card | FDM |
| 27.03 | TSU_CBuf_DRAM_AddrBus_Walking_0s_Test | Line card | FDM |
| 27.04 | TSU_CBuf_DRAM_DataBus_WalkingBit_Test | Line card | FXM |
| 27.05 | TSU_CBuf_DRAM_StuckBit_Memory_Test | Line card | FDM |
| 27.06 | TSU_CBuf_DRAM_RamData_Pattern_Test | Line card | FDM |
| 27.07 | TSU_CBuf_DRAM_Marching_1s_Test | Line card | FXM |
| 28 | TSU_External_Control_DRAM_Tests | ||
| 28.01 | TSU_Ctrl_DRAM_AddrBus_Indep_Test | Line card | FXM |
| 28.02 | TSU_Ctrl_DRAM_AddrBus_Walking_1s_Test | Line card | FDM |
| 28.03 | TSU_Ctrl_DRAM_AddrBus_Walking_0s_Test | Line card | FDM |
| 28.04 | TSU_Ctrl_DRAM_DataBus_WalkingBit_Test | Line card | FXM |
| 28.05 | TSU_Ctrl_DRAM_StuckBit_Memory_Test | Line card | FDM |
| 28.06 | TSU_Ctrl_DRAM_RamData_Pattern_Test | Line card | FDM |
| 28.07 | TSU_Ctrl_DRAM_Marching_1s_Test | Line card | FXM |
| 29 | TSU_B_Internal_ScratchPad_SRAM_Tests | ||
| 29.01 | TSU_B_SPAD_SRAM_AddrBus_Indep_Test | Line card | FXAM |
| 29.02 | TSU_B_SPAD_SRAM_AddrBus_Walking_1s_Test | Line card | FDAM |
| 29.03 | TSU_B_SPAD_SRAM_AddrBus_Walking_0s_Test | Line card | FDAM |
| 29.04 | TSU_B_SPAD_SRAM_DataBus_WalkingBit_Test | Line card | FXAM |
| 29.05 | TSU_B_SPAD_SRAM_StuckBit_Memory_Test | Line card | FDAM |
| 29.06 | TSU_B_SPAD_SRAM_RamData_Pattern_Test | Line card | FDAM |
| 29.07 | TSU_B_SPAD_SRAM_Marching_1s_Test | Line card | FXAM |
| 30 | TSU_B_External_CellBuffer_DRAM_Tests | ||
| 30.01 | TSU_B_CBuf_DRAM_AddrBus_Indep_Test | Line card | FXM |
| 30.02 | TSU_B_CBuf_DRAM_AddrBus_Walking_1s_Test | Line card | FDM |
| 30.03 | TSU_B_CBuf_DRAM_AddrBus_Walking_0s_Test | Line card | FDM |
| 30.04 | TSU_B_CBuf_DRAM_DataBus_WalkingBit_Test | Line card | FXM |
| 30.05 | TSU_B_CBuf_DRAM_StuckBit_Memory_Test | Line card | FDM |
| 30.06 | TSU_B_CBuf_DRAM_RamData_Pattern_Test | Line card | FDM |
| 30.07 | TSU_B_CBuf_DRAM_Marching_1s_Test | Line card | FXM |
| 31 | FSU_Internal_SRAM_Tests | ||
| 31.01 | FSU_Int_SRAM_AddrBus_Indep_Test | Line card | FDAM |
| 31.02 | FSU_Int_SRAM_AddrBus_Walking_1s_Test | Line card | FDAM |
| 31.03 | FSU_Int_SRAM_AddrBus_Walking_0s_Test | Line card | FDAM |
| 31.04 | FSU_Int_SRAM_DataBus_WalkingBit_Test | Line card | FDAM |
| 31.05 | FSU_Int_SRAM_StuckBit_Memory_Test | Line card | FDAM |
| 31.06 | FSU_Int_SRAM_RamData_Pattern_Test | Line card | FDAM |
| 31.07 | FSU_Int_SRAM_Marching_1s_Test | ||
| 32 | FSU_External_LRIC_SRAM_Tests | ||
| 32.01 | FSU_LRIC_SRAM_AddrBus_Indep_Test | Line card | FXM |
| 32.02 | FSU_LRIC_SRAM_AddrBus_Walking_1s_Test | Line card | FDM |
| 32.03 | FSU_LRIC_SRAM_AddrBus_Walking_0s_Test | Line card | FDM |
| 32.04 | FSU_LRIC_SRAM_DataBus_WalkingBit_Test | Line card | FXM |
| 32.05 | FSU_LRIC_SRAM_StuckBit_Memory_Test | Line card | FDM |
| 32.06 | FSU_LRIC_SRAM_RamData_Pattern_Test | Line card | FDM |
| 32.07 | FSU_LRIC_SRAM_Marching_1s_Test | Line card | FXM |
| 33 | FSU_External_CRIC_DRAM_Tests | ||
| 33.01 | FSU_CRIC_DRAM_AddrBus_Indep_Test | Line card | FXM |
| 33.02 | FSU_CRIC_DRAM_AddrBus_Walking_1s_Test | Line card | FDM |
| 33.03 | FSU_CRIC_DRAM_AddrBus_Walking_0s_Test | Line card | FDM |
| 33.04 | FSU_CRIC_DRAM_DataBus_WalkingBit_Test | Line card | FXM |
| 33.05 | FSU_CRIC_DRAM_StuckBit_Memory_Test | Line card | FDM |
| 33.06 | FSU_CRIC_DRAM_RamData_Pattern_Test | Line card | FDM |
| 33.07 | FSU_CRIC_DRAM_Marching_1s_Test | Line card | FXM |
| 34 | TSU_Functional_Register_Tests | ||
| 34.01 | TSU_A_NQP_Interrupt_test | Line card | FDA |
| 34.02 | TSU_A_DQP_Interrupt_test | Line card | FDA |
| 34.03 | TSU_A_CBUF_Error_Interrupt_test | Line card | FDA |
| 34.04 | TSU_A_CRAM_Error_Interrupt_test | Line card | FDA |
| 34.05 | TSU_A_PDBI_Error_Interrupt_test | Line card | FDA |
| 34.06 | TSU_A_Force_NQP_Trap_test | Line card | FDA |
| 34.07 | TSU_A_Force_DQP_Trap_test | Line card | FDA |
| 35 | TSU_B_Functional_Register_Tests | ||
| 35.01 | TSU_B_NQP_Interrupt_test | Line card | FDA |
| 35.02 | TSU_B_DQP_Interrupt_test | Line card | FDA |
| 35.03 | TSU_B_CBUF_Error_Interrupt_test | Line card | FDA |
| 35.04 | TSU_B_CRAM_Error_Interrupt_test | Line card | FDA |
| 35.05 | TSU_B_PDBI_Error_Interrupt_test | Line card | FDA |
| 35.06 | TSU_B_Force_NQP_Trap_test | Line card | FDA |
| 35.07 | TSU_B_Force_DQP_Trap_test | Line card | FDA |
| 36 | FSU_Functional_Register_Tests | ||
| 36.01 | FSU_ISMC_Interrupt_test | Line card | FDA |
| 36.02 | FSU_OSMC_Interrupt_test | Line card | FDA |
| 36.03 | FSU_IVAL_Interrupt_test | Line card | FDA |
| 36.04 | FSU_PDBI_Error_Interrupt_test | Line card | FDA |
| 36.05 | FSU_TRAP_Error_Interrupt_test | Line card | FDA |
| 36.06 | FSU_CAVL_Interrupt_test | Line card | FDA |
| 36.07 | FSU_Force_OSMC_Trap_test | Line card | FDA |
| 36.08 | FSU_Force_ISMC_Trap_test | Line card | FDA |
| 37 | Cell_lpbk_Tsu_A_Ext_SWA_Test | Line card | FSA |
| 38 | Cell_lpbk_Tsu_A_Ext_SWB_Test | Line card | FSA |
| 39 | Cell_lpbk_Tsu_B_Ext_SWA_Test | Line card | FSA |
| 40 | Cell_lpbk_Tsu_B_Ext_SWB_Test | Line card | FSA |
| 41 | Cell_lpbk_Tsu_A_Int_SWA_Test | Line card | FDA |
| 42 | Cell_lpbk_Tsu_A_Int_SWB_Test | Line card | FDA |
| 43 | Cell_lpbk_Tsu_B_Int_SWA_Test | Line card | FDA |
| 44 | Cell_lpbk_Tsu_B_Int_SWB_Test | Line card | FDA |
| 45 | Cell_lpbk_Tsu_A_Int_SWA_FSU_B_Test | Line card | FDA |
| 46 | Cell_lpbk_Tsu_A_Int_SWB_FSU_A_Test | Line card | FDA |
| 47 | RATO_lpbk_Tsu_A_Int_SWA_Test | Line card | FDA |
| 48 | Metering__Tsu_A_Int_SWA_Test | Line card | FDA |
| 49 | OC3_Access_Card_Tests | ||
| 49.01 | OC3_Access_Voltage_Sensor_Test | Access card | FDT |
| 49.02 | OC3_Access_Temperature_Sensor_Test | Access card | FDT |
| 49.03 | OC3_PMC5345_Register_Test | Access card | FD |
| 49.04 | OC3_Nettime_PLL_Local_Test | Access card | FD |
| 49.05 | OC3_Nettime_PLL_SWA_Test | Access card | N |
| 49.06 | OC3_Nettime_PLL_SWB_Test | Access card | N |
| 49.07 | OC3_Nettime_PLL_SWA_SWB_Test | Access card | N |
| 49.08 | OC3_IRQ1_Interrupt_Test | Access card | FD |
| 49.09 | OC3_IRQ0_Interrupt_Test | Access card | FD |
| 49.10 | OC3_Internal_Lpbk_Test | Access card | FD |
| 49.11 | OC3_Internal_Multi_VCI_Lpbk_Test | Access card | FD |
| 49.12 | OC3_Internal_MultiCast_Lpbk_Test | Access card | FD |
| 49.13 | OC3_External_Lpbk_Test | Access card | FL |
| 49.14 | OC3_External_Multi_VCI_Lpbk_Test | Access card | FL |
| 49.15 | OC3_External_MultiCast_Lpbk_Test | Access card | FL |
| 49.16 | OC3_External_Cross_Test | Access card | FL |
| 49.17 | OC3_External_MultiCast_Cross_Test | Access card | FL |
| 49.18 | OC3_External_Cross_Line_Lpbk_Test | Access card | FL |
| 49.19 | OC3_External_Port1_LoopT_Cross_Test | Access card | FL |
| 49.20 | OC3_External_Port2_LoopT_Cross_Test | Access card | FL |
| 49.21 | OC3_Manual_Tests | ||
| 49.21.01 | OC3_Access_EEPROM_Test | Access card | MT |
| 49.21.02 | OC3_Access_OEM_EEPROM_Test | Access card | MT |
| 49 | T3_Access_Card_Tests | ||
| 49 | E3_Access_Card_Tests | ||
| 49 | E2_Access_Card_Tests | ||
| 49.01 | T3E3/2_Access_Voltage_Sensor_Test | Access card | FD |
| 49.02 | T3E3/2_Access_Temperature_Sensor_Test | Access card | FD |
| 49.03 | T3E3/2_PDH_Register_Test | Access card | FD |
| 49.04 | T3E3/2_Nettime_PLL_Local_Reference_Test | Access card | FD |
| 49.05 | T3E3/2_Nettime_PLL_SWA_Test | Access card | FD |
| 49.06 | T3E3/2_Nettime_PLL_SWB_Test | Access card | FD |
| 49.07 | T3E3/2_Nettime_PLL_SWA_SWB_Test | Access card | FD |
| 49.08 | T3E3/2_PerPort_PDH_Lpbk_Test | Access card | FD |
| 49.09 | E2_PerPort_FMR_Lpbk_Test | Access card | FD |
| 49.10 | T3E3/2_PerPort_ART/MRT_Lpbk_Test | Access card | FD |
| 49.11 | T3E3/2_PerPort_Extrnl_Lpbk_Test | Access card | FL |
| 49.12 | T3E3/2_MultiPorts_PDH_Lpbk_Test | Access card | FD |
| 49.13 | T3E3/2_MultiPorts_ART/MRT_Lpbk_Test | Access card | FD |
| 49.14 | T3E3/2_Multi_VCI_Ports_PDH_Lpbk_Test | Access card | Z |
| 49.15 | T3E3/2_Multi_VCI_Ports_ART/MRT_Lpbk_Test | Access card | Z |
| 49.16 | T3E3/2_Internal_MultiCast_TsuA_Test | Access card | FD |
| 49.17 | T3E3/2_Internal_MultiCast_TsuB_Test | Access card | FD |
| 49.18 | T3E3/2_Access_EEPROM_Test | Access card | MT |
| 49.19 | T3E3/2_Access_OEM_EEPROM_Test | Access card | MT |
| No. | Name | Card | Notes |
|---|---|---|---|
| 01 | CP_Flash_Checksum_Test | Line card | FDM |
| 02 | EEPROM_Checksum_Tests | ||
| 02.01 | HC11_Configuration_EEPROM_Checksum_Test | Line card | DMT |
| 02.02 | HC11_Application_EEPROM_Checksum_Test | Line card | DMT |
| 02.03 | Access_Card_EEPROM_Checksum_Test | Access card | DMT |
| 02.04 | Access_Card_OEM_EEPROM_Checksum_Test | Access card | DMT |
| 03 | CP_DRAM_Tests | ||
| 03.01 | CP_to_DRAM_AddrBus_Indep_Test | Line card | FXM |
| 03.02 | CP_to_DRAM_AddrBus_Walking_1s_Test | Line card | FDM |
| 03.03 | CP_to_DRAM_AddrBus_Walking_0s_Test | Line card | FDM |
| 03.04 | CP_to_DRAM_DataBus_WalkingBit_Test | Line card | FXM |
| 03.05 | CP_to_DRAM_StuckBit_Memory_Test | Line card | FDM |
| 03.06 | CP_to_DRAM_RamData_Pattern_Test | Line card | FDM |
| 03.07 | CP_to_DRAM_Marching_1s_Test | Line card | FXM |
| 03.08 | CP_to_DRAM_Refresh_Test | Line card | FXM |
| 04 | CP_Parity_Test | Line card | FXM |
| 05 | CP_Parity_Buffer_Test | Line card | FXM |
| 06 | CP_Parity_DRAM_Test | Line card | FDM |
| 07 | CP_PDBL_SRAM_Tests | ||
| 07.01 | CP_to_PDBL_SRAM_AddrBus_Indep_Test | Line card | FXM |
| 07.02 | CP_to_PDBL_SRAM_AddrBus_Walking_1s_Test | Line card | FDM |
| 07.03 | CP_to_PDBL_SRAM_AddrBus_Walking_0s_Test | Line card | FDM |
| 07.04 | CP_to_PDBL_SRAM_DataBus_WalkingBit_Test | Line card | FXM |
| 07.05 | CP_to_PDBL_SRAM_StuckBit_Memory_Test | Line card | FDM |
| 07.06 | CP_to_PDBL_SRAM_RamData_Pattern_Test | Line card | FDM |
| 07.07 | CP_to_PDBL_SRAM_Marching_1s_Test | Line card | FXM |
| 08 | TSU_NQP_uStore_Memory_Tests | ||
| 08.01 | NQP_uStore_AddrBus_Indep_Test | Line card | FXAM |
| 08.02 | NQP_uStore_AddrBus_Walking_1s_Test | Line card | FDAM |
| 08.03 | NQP_uStore_AddrBus_Walking_0s_Test | Line card | FDAM |
| 08.04 | NQP_uStore_DataBus_WalkingBit_Test | Line card | FXAM |
| 08.05 | NQP_uStore_StuckBit_Memory_Test | Line card | FDAM |
| 08.06 | NQP_uStore_RamData_Pattern_Test | Line card | FDAM |
| 08.07 | NQP_uStore_Marching_1s_Test | Line card | FXAM |
| 09 | TSU_DQP_uStore_Memory_Tests | ||
| 09.01 | DQP_uStore_AddrBus_Indep_Test | Line card | FXAM |
| 09.02 | DQP_uStore_AddrBus_Walking_1s_Test | Line card | FDAM |
| 09.03 | DQP_uStore_AddrBus_Walking_0s_Test | Line card | FDAM |
| 09.04 | DQP_uStore_DataBus_WalkingBit_Test | Line card | FXAM |
| 09.05 | DQP_uStore_StuckBit_Memory_Test | Line card | FDAM |
| 09.06 | DQP_uStore_RamData_Pattern_Test | Line card | FDAM |
| 09.07 | DQP_uStore_Marching_1s_Test | Line card | FXAM |
| 10 | TSU_Internal_Timer_SRAM_Tests | ||
| 10.01 | TSU_Timer_SRAM_AddrBus_Indep_Test | Line card | FXAM |
| 10.02 | TSU_Timer_SRAM_AddrBus_Walking_1s_Test | Line card | FDAM |
| 10.03 | TSU_Timer_SRAM_AddrBus_Walking_0s_Test | Line card | FDAM |
| 10.04 | TSU_Timer_SRAM_DataBus_WalkingBit_Test | Line card | FXAM |
| 10.05 | TSU_Timer_SRAM_StuckBit_Memory_Test | Line card | FDAM |
| 10.06 | TSU_Timer_SRAM_RamData_Pattern_Test | Line card | FDAM |
| 10.07 | TSU_Timer_SRAM_Marching_1s_Test | Line card | FXAM |
| 11 | TSU_Internal_CellFifo_SRAM_Tests | ||
| 11.01 | TSU_CellFifo_AddrBus_Indep_Test | Line card | FXAM |
| 11.02 | TSU_CellFifo_AddrBus_Walking_1s_Test | Line card | FDAM |
| 11.03 | TSU_CellFifo_AddrBus_Walking_0s_Test | Line card | FDAM |
| 11.04 | TSU_CellFifo_DataBus_WalkingBit_Test | Line card | FXAM |
| 11.05 | TSU_CellFifo_StuckBit_Memory_Test | Line card | FDAM |
| 11.06 | TSU_CellFifo_RamData_Pattern_Test | Line card | FDAM |
| 11.07 | TSU_CellFifo_Marching_1s_Test | Line card | FXAM |
| 12 | FSU_OSMC_uStore_Memory_Tests | ||
| 12.01 | OSMC_uStore_AddrBus_Indep_Test | Line card | FXAM |
| 12.02 | OSMC_uStore_AddrBus_Walking_1s_Test | Line card | FDAM |
| 12.03 | OSMC_uStore_AddrBus_Walking_0s_Test | Line card | FDAM |
| 12.04 | OSMC_uStore_DataBus_WalkingBit_Test | Line card | FXAM |
| 12.05 | OSMC_uStore_StuckBit_Memory_Test | Line card | FDAM |
| 12.06 | OSMC_uStore_RamData_Pattern_Test | Line card | FDAM |
| 12.07 | OSMC_uStore_Marching_1s_Test | Line card | FXAM |
| 13 | FSU_ISMC_uStore_Memory_Tests | ||
| 13.01 | ISMC_uStore_AddrBus_Indep_Test | Line card | FXAM |
| 13.02 | ISMC_uStore_AddrBus_Walking_1s_Test | Line card | FDAM |
| 13.03 | ISMC_uStore_AddrBus_Walking_0s_Test | Line card | FDAM |
| 13.04 | ISMC_uStore_DataBus_WalkingBit_Test | Line card | FXAM |
| 13.05 | ISMC_uStore_StuckBit_Memory_Test | Line card | FDAM |
| 13.06 | ISMC_uStore_RamData_Pattern_Test | Line card | FDAM |
| 13.07 | ISMC_uStore_Marching_1s_Test | Line card | FXAM |
| 14 | TLU_TLP_uStore_Memory_Tests | ||
| 14.01 | TLP_uStore_AddrBus_Indep_Test | Line card | FXAM |
| 14.02 | TLP_uStore_AddrBus_Walking_1s_Test | Line card | FDAM |
| 14.03 | TLP_uStore_AddrBus_Walking_0s_Test | Line card | FDAM |
| 14.04 | TLP_uStore_DataBus_WalkingBit_Test | Line card | FXAM |
| 14.05 | TLP_uStore_StuckBit_Memory_Test | Line card | FDAM |
| 14.06 | TLP_uStore_RamData_Pattern_Test | Line card | FDAM |
| 14.07 | TLP_uStore_Marching_1s_Test | Line card | FXAM |
| 15 | TLU_RP_uStore_Memory_Tests | ||
| 15.01 | RP_uStore_AddrBus_Indep_Test | Line card | FXAM |
| 15.02 | RP_uStore_AddrBus_Walking_1s_Test | Line card | FDAM |
| 15.03 | RP_uStore_AddrBus_Walking_0s_Test | Line card | FDAM |
| 15.04 | RP_uStore_DataBus_WalkingBit_Test | Line card | FXAM |
| 15.05 | RP_uStore_StuckBit_Memory_Test | Line card | FDAM |
| 15.06 | RP_uStore_RamData_Pattern_Test | Line card | FDAM |
| 15.07 | RP_uStore_Marching_1s_Test | Line card | FXAM |
| 16 | FLU_FLP_uStore_Memory_Tests | ||
| 16.01 | FLP_uStore_AddrBus_Indep_Test | Line card | FXAM |
| 16.02 | FLP_uStore_AddrBus_Walking_1s_Test | Line card | FDAM |
| 16.03 | FLP_uStore_AddrBus_Walking_0s_Test | Line card | FDAM |
| 16.04 | FLP_uStore_DataBus_WalkingBit_Test | Line card | FXAM |
| 16.05 | FLP_uStore_StuckBit_Memory_Test | Line card | FDAM |
| 16.06 | FLP_uStore_RamData_Pattern_Test | Line card | FDAM |
| 16.07 | FLP_uStore_Marching_1s_Test | Line card | FXAM |
| 17 | FLU_ALF_uStore_Memory_Tests | ||
| 17.01 | ALF_uStore_AddrBus_Indep_Test | Line card | FXAM |
| 17.02 | ALF_uStore_AddrBus_Walking_1s_Test | Line card | FDAM |
| 17.03 | ALF_uStore_AddrBus_Walking_0s_Test | Line card | FDAM |
| 17.04 | ALF_uStore_DataBus_WalkingBit_Test | Line card | FXAM |
| 17.05 | ALF_uStore_StuckBit_Memory_Test | Line card | FDAM |
| 17.06 | ALF_uStore_RamData_Pattern_Test | Line card | FDAM |
| 17.07 | ALF_uStore_Marching_1s_Test | Line card | FXAM |
| 18 | TSU_Register_Walking_1s_and_0s_Test | Line card | FDA |
| 19 | FSU_Register_Walking_1s_and_0s_Test | Line card | FDA |
| 20 | TLU_Register_Walking_1s_and_0s_Test | Line card | FDA |
| 21 | FLU_Register_Walking_1s_and_0s_Test | Line card | FDA |
| 22 | TSU_uDiagnostic_Tests | ||
| 22.01 | TSU_Generic_Tests | Line card | DA |
| 22.02 | TSU_NQP_External_Tests | Line card | DA |
| 22.03 | TSU_NQP_Cell_Buffer_Tests | Line card | DAM |
| 22.04 | TSU_NQP_Control_RAM_Tests | Line card | DAM |
| 22.05 | TSU_NQP_ScratchPad_Tests | Line card | DAM |
| 22.06 | TSU_NQP_PDBS_Tests | Line card | DA |
| 22.07 | TSU_NQP_Miscellaneous_Tests | Line card | DA |
| 22.08 | TSU_DQP_External_Tests | Line card | DA |
| 22.09 | TSU_DQP_Cell_Buffer_Tests | Line card | DAM |
| 22.10 | TSU_DQP_Control_RAM_Tests | Line card | DAM |
| 22.11 | TSU_DQP_ScratchPad_Tests | Line card | DAM |
| 22.12 | TSU_NQP_RamTests | Line card | AM |
| 22.13 | TSU_DQP_RamTests | Line card | AM |
| 23 | FSU_uDiagnostic_Tests | ||
| 23.01 | FSU_Generic_Tests | Line card | DA |
| 23.02 | FSU_ISMC_External_Tests | Line card | DA |
| 23.03 | FSU_ISMC_IRAM_Tests | Line card | DAM |
| 23.04 | FSU_ISMC_Miscellaneous_Tests | Line card | DA |
| 23.05 | FSU_ISMC_LRIC_Tests | Line card | DA |
| 23.06 | FSU_OSMC_External_Tests | Line card | DA |
| 23.07 | FSU_OSMC_IRAM_Tests | Line card | DAM |
| 23.08 | FSU_OSMC_Miscellaneous_Tests | Line card | DA |
| 23.09 | FSU_OSMC_LRIC_Tests | Line card | DA |
| 23.10 | FSU_OSMC_CRIC_Tests | Line card | DA |
| 23.11 | FSU_OSMC_PDBS_Tests | Line card | DA |
| 23.12 | FSU_OSMC_Priority_Encoder_Tests | Line card | DA |
| 23.13 | FSU_ISMC_RamTests | Line card | AM |
| 23.14 | FSU_OSMC_RamTests | Line card | AM |
| 24 | TLU_uDiagnostic_Tests | ||
| 24.01 | TLU_Generic_Tests | Line card | DA |
| 24.02 | TLU_RP_Cell_Buffer_Tests | Line card | DAM |
| 24.03 | TLU_RP_Miscellaneous_Tests | Line card | DA |
| 24.04 | TLU_RP_XRI_Tests | Line card | DA |
| 24.05 | TLU_TLP_XRAM_Tests | Line card | DAM |
| 24.06 | TLU_TLP_Miscellaneous_Tests | Line card | DA |
| 24.07 | TLU_TLP_PDBL_Tests | Line card | DA |
| 24.08 | TLU_RP_RamTests | Line card | AM |
| 24.09 | TLU_TLP_RamTests | Line card | AM |
| 25 | FLU_uDiagnostic_Tests | ||
| 25.01 | FLU_Generic_Tests | Line card | DA |
| 25.02 | FLU_FLP_External_Tests | Line card | DA |
| 25.03 | FLU_FLP_XRAM_Tests | Line card | DAM |
| 25.04 | FLU_FLP_PDBL_Tests | Line card | DA |
| 25.05 | FLU_ALF_External_Tests | Line card | DA |
| 25.06 | FLU_ALF_RamTests | Line card | AM |
| 26 | FSU_RealTimeClock_Test | Line card | FXA |
| 27 | FSU_IntervalTimer_Test | Line card | FXA |
| 28 | TLU_HoldoffTimer_Test | Line card | FDA |
| 29 | TCS_NMI_Test | Line card | DT |
| 30 | TSU_Internal_ScratchPad_SRAM_Tests | ||
| 30.01 | TSU_SPAD_SRAM_AddrBus_Indep_Test | Line card | FXAM |
| 30.02 | TSU_SPAD_SRAM_AddrBus_Walking_1s_Test | Line card | FDAM |
| 30.03 | TSU_SPAD_SRAM_AddrBus_Walking_0s_Test | Line card | FDAM |
| 30.04 | TSU_SPAD_SRAM_DataBus_WalkingBit_Test | Line card | FXAM |
| 30.05 | TSU_SPAD_SRAM_StuckBit_Memory_Test | Line card | FDAM |
| 30.06 | TSU_SPAD_SRAM_RamData_Pattern_Test | Line card | FDAM |
| 30.07 | TSU_SPAD_SRAM_Marching_1s_Test | Line card | FXAM |
| 31 | TSU_External_CellBuffer_DRAM_Tests | ||
| 31.01 | TSU_CBuf_DRAM_AddrBus_Indep_Test | Line card | FXM |
| 31.02 | TSU_CBuf_DRAM_AddrBus_Walking_1s_Test | Line card | FDM |
| 31.03 | TSU_CBuf_DRAM_AddrBus_Walking_0s_Test | Line card | FDM |
| 31.04 | TSU_CBuf_DRAM_DataBus_WalkingBit_Test | Line card | FXM |
| 31.05 | TSU_CBuf_DRAM_StuckBit_Memory_Test | Line card | FDM |
| 31.06 | TSU_CBuf_DRAM_RamData_Pattern_Test | Line card | FDM |
| 31.07 | TSU_CBuf_DRAM_Marching_1s_Test | Line card | FXM |
| 32 | TSU_External_Control_DRAM_Tests | ||
| 32.01 | TSU_Ctrl_DRAM_AddrBus_Indep_Test | Line card | FXM |
| 32.02 | TSU_Ctrl_DRAM_AddrBus_Walking_1s_Test | Line card | FDM |
| 32.03 | TSU_Ctrl_DRAM_AddrBus_Walking_0s_Test | Line card | FDM |
| 32.04 | TSU_Ctrl_DRAM_DataBus_WalkingBit_Test | Line card | FXM |
| 32.05 | TSU_Ctrl_DRAM_StuckBit_Memory_Test | Line card | FDM |
| 32.06 | TSU_Ctrl_DRAM_RamData_Pattern_Test | Line card | FDM |
| 32.07 | TSU_Ctrl_DRAM_Marching_1s_Test | Line card | FXM |
| 33 | FSU_Internal_SRAM_Tests | ||
| 33.01 | FSU_Int_SRAM_AddrBus_Indep_Test | Line card | FXAM |
| 33.02 | FSU_Int_SRAM_AddrBus_Walking_1s_Test | Line card | FDAM |
| 33.03 | FSU_Int_SRAM_AddrBus_Walking_0s_Test | Line card | FDAM |
| 33.04 | FSU_Int_SRAM_DataBus_WalkingBit_Test | Line card | FXAM |
| 33.05 | FSU_Int_SRAM_StuckBit_Memory_Test | Line card | FDAM |
| 33.06 | FSU_Int_SRAM_RamData_Pattern_Test | Line card | FDAM |
| 33.07 | FSU_Int_SRAM_Marching_1s_Test | Line card | FXAM |
| 34 | FSU_External_LRIC_SRAM_Tests | ||
| 34.01 | FSU_LRIC_SRAM_AddrBus_Indep_Test | Line card | FXM |
| 34.02 | FSU_LRIC_SRAM_AddrBus_Walking_1s_Test | Line card | FDM |
| 34.03 | FSU_LRIC_SRAM_AddrBus_Walking_0s_Test | Line card | FDM |
| 34.04 | FSU_LRIC_SRAM_DataBus_WalkingBit_Test | Line card | FXM |
| 34.05 | FSU_LRIC_SRAM_StuckBit_Memory_Test | Line card | FDM |
| 34.06 | FSU_LRIC_SRAM_RamData_Pattern_Test | Line card | FDM |
| 34.07 | FSU_LRIC_SRAM_Marching_1s_Test | Line card | FXM |
| 35 | FSU_External_CRIC_DRAM_Tests | ||
| 35.01 | FSU_CRIC_DRAM_AddrBus_Indep_Test | Line card | FXM |
| 35.02 | FSU_CRIC_DRAM_AddrBus_Walking_1s_Test | Line card | FDM |
| 35.03 | FSU_CRIC_DRAM_AddrBus_Walking_0s_Test | Line card | FDM |
| 35.04 | FSU_CRIC_DRAM_DataBus_WalkingBit_Test | Line card | FXM |
| 35.05 | FSU_CRIC_DRAM_StuckBit_Memory_Test | Line card | FDM |
| 35.06 | FSU_CRIC_DRAM_RamData_Pattern_Test | Line card | FDM |
| 35.07 | FSU_CRIC_DRAM_Marching_1s_Test | Line card | FXM |
| 36 | TLU_External_DRAM_Tests | ||
| 36.01 | TLU_Ext_DRAM_AddrBus_Indep_Test | Line card | FXM |
| 36.02 | TLU_Ext_DRAM_AddrBus_Walking_1s_Test | Line card | FDM |
| 36.03 | TLU_Ext_DRAM_AddrBus_Walking_0s_Test | Line card | FDM |
| 36.04 | TLU_Ext_DRAM_DataBus_WalkingBit_Test | Line card | FXM |
| 36.05 | TLU_Ext_DRAM_StuckBit_Memory_Test | Line card | FDM |
| 36.06 | TLU_Ext_DRAM_RamData_Pattern_Test | Line card | FDM |
| 36.07 | TLU_Ext_DRAM_Marching_1s_Test | Line card | FXM |
| 37 | FLU_External_ParseGraph_SRAM_Tests | ||
| 37.01 | FLU_Parse_SRAM_AddrBus_Indep_Test | Line card | FXM |
| 37.02 | FLU_Parse_DRAM_AddrBus_Walking_1s_Test | Line card | FDM |
| 37.03 | FLU_Parse_DRAM_AddrBus_Walking_0s_Test | Line card | FDM |
| 37.04 | FLU_Parse_DRAM_DataBus_WalkingBit_Test | Line card | FXM |
| 37.05 | FLU_Parse_DRAM_StuckBit_Memory_Test | Line card | FDM |
| 37.06 | FLU_Parse_DRAM_RamData_Pattern_Test | Line card | FDM |
| 37.07 | FLU_Parse_DRAM_Marching_1s_Test | Line card | FXM |
| 38 | FLU_External_Protocol_DRAM_Tests | ||
| 38.01 | FLU_Proto_DRAM_AddrBus_Indep_Test | Line card | FXM |
| 38.02 | FLU_Proto_DRAM_AddrBus_Walking_1s_Test | Line card | FDM |
| 38.03 | FLU_Proto_DRAM_AddrBus_Walking_0s_Test | Line card | FDM |
| 38.04 | FLU_Proto_DRAM_DataBus_WalkingBit_Test | Line card | FXM |
| 38.05 | FLU_Proto_DRAM_StuckBit_Memory_Test | Line card | FDM |
| 38.06 | FLU_Proto_DRAM_RamData_Pattern_Test | Line card | FDM |
| 38.07 | FLU_Proto_DRAM_Marching_1s_Test | Line card | FXM |
| 39 | TSU_Functional_Register_Tests | ||
| 39.01 | TSU_NQP_Interrupt_test | Line card | FDA |
| 39.02 | TSU_DQP_Interrupt_test | Line card | FDA |
| 39.03 | TSU_CBUF_Error_Interrupt_test | Line card | FDA |
| 39.04 | TSU_CRAM_Error_Interrupt_test | Line card | FDA |
| 39.05 | TSU_PDBI_Error_Interrupt_test | Line card | FDA |
| 39.06 | TSU_Force_NQP_Trap_test | Line card | FDA |
| 39.07 | TSU_Force_DQP_Trap_test | Line card | FDA |
| 40 | FSU_Functional_Register_Tests | ||
| 40.01 | FSU_ISMC_Interrupt_test | Line card | FDA |
| 40.02 | FSU_OSMC_Interrupt_test | Line card | FDA |
| 40.03 | FSU_IVAL_Interrupt_test | Line card | FDA |
| 40.04 | FSU_PDBI_Error_Interrupt_test | Line card | FDA |
| 40.05 | FSU_TRAP_Error_Interrupt_test | Line card | FDA |
| 40.06 | FSU_CAVL_Interrupt_test | Line card | FDA |
| 40.07 | FSU_Force_OSMC_Trap_test | Line card | FDA |
| 40.08 | FSU_Force_ISMC_Trap_test | Line card | FDA |
| 41 | TLU_Functional_Register_Tests | ||
| 41.01 | TLU_TLP_Interrupt_Test | Line card | FDA |
| 41.02 | TLU_RP_Interrupt_Test | Line card | FDA |
| 41.03 | TLU_PDBI_Interrupt_Test | Line card | FDA |
| 41.04 | TLU_XRAM_Parity_Interrupt_Test | Line card | FDA |
| 41.05 | TLU_TLP_Trap_Interrupt_Test | Line card | FDA |
| 41.06 | TLU_RP_Trap_Interrupt_Test | Line card | FDA |
| 41.07 | TLU_XRAM_Parity_Trap_Interrupt_Test | Line card | FDA |
| 42 | FLU_Functional_Register_Tests | ||
| 42.01 | FLU_FLP_Interrupt_Test | Line card | FDA |
| 42.02 | FLU_ALF_Interrupt_Test | Line card | FDA |
| 42.03 | FLU_PDBI_Interrupt_Test | Line card | FDA |
| 42.04 | FLU_PMEM_Parity_Interrupt_Test | Line card | FDA |
| 42.05 | FLU_FLP_Trap_Interrupt_Test | Line card | FDA |
| 42.06 | FLU_ALF_Trap_Interrupt_Test | Line card | FDA |
| 42.07 | FLU_PMEM_Parity_Trap_Interrupt_Test | Line card | FDA |
| 43 | TSU_FSU_SWA_External_Lpbk_Test | Line card | FSA |
| 44 | TSU_FSU_SWA_Internal_Lpbk_A_Test | Line card | FDA |
| 45 | TSU_FSU_SWA_Internal_Lpbk_B_Test | Line card | FDA |
| 46 | TSU_FSU_SWB_External_Lpbk_Test | Line card | FSA |
| 47 | TSU_FSU_SWB_Internal_Lpbk_B_Test | Line card | FDA |
| 48 | TSU_FSU_SWB_Internal_Lpbk_A_Test | Line card | FDA |
| 49 | TSU_FSU_MultiCast_Internal_Lpbk_Test | Line card | FDA |
| 50 | TSU_FSU_Smoothing_Internal_Lpbk_Test | Line card | FDA |
| 51 | TSU_FSU_RATO_Internal_Lpbk_Test | Line card | FDA |
| 52 | TSU_TLU_Internal_Lpbk_Test | Line card | FDA |
| 53 | FLU_FSU_Internal_Lpbk_Test | Line card | FDA |
| 54 | FLU_TLU_Internal_Lpbk_Test | Line card | FDA |
| 55 | FDDI_Access_Card_Tests | ||
| 55.01 | FDDI_CSR_Register_Test | Access card | FD |
| 55.02 | CAM_Walking_Bit_Test | Access card | FD |
| 55.03 | FDDI_CAM_Unique_Data_Test | Access card | FD |
| 55.04 | FDDI_CAM_Address_Data_Test | Access card | FD |
| 55.05 | FDDI_CAM_Pattern_Data_Test | Access card | FD |
| 55.06 | FDDI_MAC_EPROM_Checksum_Test | Access card | FD |
| 55.07 | FDDI_Register_Test | Access card | FD |
| 55.08 | FDDI_MAC_Loop_Test | Access card | FD |
| 55.09 | FDDI_LM_Loop_Test | Access card | FD |
| 55.10 | FDDI_EB_Loop_Test | Access card | FD |
| 55.11 | FDDI_FCG_Loop_Test | Access card | FD |
| 55.12 | FDDI_Loopback_Test | Access card | FL |
| 55.13 | FDDI_CAM_Logic_Test | Access card | FD |
| 55.14 | TSU_FDDI_Loopback_Test | Access card | FDA |
| 55.15 | FLU_FDDI_Loopback_Test | Access card | FDA |
| 55.16 | FLU_FDDI_Loopback_Test#1 | Access card | FDA |
| 55.17 | FDDI_Interrupt_Test | Access card | FD |
| 55.18 | CAM_Interrupt_Test | Access card | FD |
| 55 | Ethernet_Access_Card_Tests | ||
| 55.01 | Ethernet_CSR_Reg_Test | Access card | FD |
| 55.02 | Ethernet_Voltage_Test | Access card | FD |
| 55.03 | Ethernet_MAC_EPROM_Checksum_Test | Access card | FD |
| 55.04 | Ethernet_NOP_Test | Access card | FD |
| 55.05 | Ethernet_Self_Test | Access card | FD |
| 55.06 | Ethernet_interrupt_test | Access card | FD |
| 55.07 | Ethernet_Int_Loopback_Test | Access card | FD |
| 55.08 | Ethernet_XCVR_Loopback_Test | Access card | FD |
| 55.09 | Ethernet_AUI_Loopback_Test | Access card | FL |
| 55.10 | Ethernet_Bus_Arbitration_Test | Access card | FD |
| 55.11 | Ethernet_Bus_Internal_Test | Access card | FD |
| 55.12 | Ethernet_Bus_External_Test | Access card | FL |
| 55.13 | Ethernet_XC_I_Loopback_Test | Access card | FD |
| 55.14 | Ethernet_XC_X_Loopback_Test | Access card | FD |
| 55.15 | Ethernet_XC_E_Loopback_Test | Access card | FL |
| 55 | Fiber_Ethernet_Access_Card_Tests | Access card | FD |
| 55.01 | Fiber_Ethernet_CSR_Reg_Test | Access card | FD |
| 55.02 | Fiber_Ethernet_Voltage_Test | Access card | FD |
| 55.03 | Fiber_Ethernet_MAC_EPROM_Checksum_Test | Access card | FD |
| 55.04 | Fiber_Ethernet_NOP_Test | Access card | FD |
| 55.05 | Fiber_Ethernet_Self_Test | Access card | FD |
| 55.06 | Fiber_Ethernet_Int_Loopback_Test | Access card | FD |
| 55.07 | Fiber_Ethernet_XCVR_Loopback_Test | Access card | FD |
| 55.08 | Fiber_Ethernet_Bus_Arbitration_Test | Access card | FD |
| 55.09 | Fiber_Ethernet_Bus_Internal_Test | Access card | FD |
| 55.10 | Fiber_Ethernet_interrupt_test | Access card | FD |
| 55.11 | Fiber_Ethernet_XC_I_Loopback_Test | Access card | FD |
| 55.12 | Fiber_Ethernet_XC_X_Loopback_Test | Access card | FD |
| 55.13 | Fiber_Ethernet_XC_E_Loopback_Test | Access card | FL |
| 55 | Serial_Access_Card_Tests | ||
| 55.01 | Serial_CSR_Reg_Test | Access card | FD |
| 55.02 | Serial_Self_Test | Access card | FD |
| 55.03 | Serial_Int_Serial_Lpbk_Test(64 bytes) | Access card | FD |
| 55.04 | Serial_Int_Intrlv_Lpbk_Test(64 bytes) | Access card | FD |
| 55.05 | Serial_Ext_Intrlv_Lpbk_Test(64 bytes) | Access card | FL |
| 55.06 | Serial_Int_Intrlv_Lpbk_Test(1520 bytes) | Access card | FD |
| 55.07 | Serial_Ext_Serial_Lpbk_Test(1520 bytes) | Access card | FL |
| 55.08 | Serial_V35_External_Lpbk_Test | Access card | FL |
| 55.09 | Serial_RS449_External_Lpbk_Test | Access card | FL |
| 55.10 | Serial_Bus_Arbitration_Test | Access card | FD |
| 55.11 | Serial_Octart_Register_Test | Access card | FD |
| 55.12 | Serial_Octart_Int_Loopback_Test | Access card | FD |
| 55.13 | Serial_Octart_Ext_Loopback_Test | Access card | FL |
| 55.14 | Serial_Clock_Measure_Test (external) | Access card | FL |
| 55.15 | Serial_Internal_Loopback_Chain_Test | Access card | FDA |
| 55.16 | Serial_X21_Self_Clocking_Ext_Lpbk_Test | Access card | FD |
| 55.17 | Serial_MAC_EPROM_Checksum_Test | Access card | FD |
| 55 | CEM_Access_Card_Tests | ||
| 55.01 | CEMAC_Serial_EEPROM_Test | Access card | FD |
| 55.02 | CEMAC_Voltage_Sensor_Test | Access card | FD |
| 55.03 | CEMAC_Temperature_Sensor_Test | Access card | FD |
| 55.04 | CEMAC_Main_PLD_Registers_Test | Access card | FD |
| 55.05 | CEMAC_Pre_Port_PLD_CSR_Test | Access card | FD |
| 55.06 | CEMAC_Global_Pre_Port_PLD_CSR_Test | Access card | FD |
| 55.07 | CEMAC_Per_Port_Data_Buffer_Flag_Test | Access card | FD |
| 55.08 | CEMAC_Per_Port_Residual_Time_Stamp_Test | Access card | FD |
| 55.09 | CEMAC_Per_Port_Receive_Clock_Test | Access card | FD |
| 55.10 | CEMAC_Nettime_PLL_SWA_Test | Access card | N |
| 55.11 | CEMAC_Nettime_PLL_SWB_Test | Access card | N |
| 55.12 | CEMAC_Nettime_PLL_SWA_SWB_Test | Access card | N |
| 55.13 | CEMAC_Per_Port_External_Loopback_Test | Access card | FL |
| 55.14 | CEMAC_Multi_Ports_External_Loopback_Test | Access card | FL |
| 55.15 | CEMAC_FluTlu_Lpkb_Using_ADAPTIVE_CLOCK | Access card | FD |
| 55.16 | CEMAC_FluTlu_Lpkb_Using_SRTS | Access card | FD |
| 55.17 | CEMAC_FluTlu_Lpkb_Using_SYNC_CLOCK | Access card | FD |
| No. | Name | Card | Notes |
|---|---|---|---|
| 01 | CP_Flash_Checksum_Test | Line card | FDM |
| 02 | mc68340_Chan1_DMA_DRAM_to_SHMEM_Test | Line card | FD |
| 03 | mc68340_Chan2_DMA_DRAM_to_SHMEM_Test | Line card | FD |
| 04 | mc68340_Timer1_Test | Line card | FD |
| 05 | mc68340_Timer2_Test | Line card | FD |
| 06 | mc68340_UART_A_Internal_Loopback_Test | Line card | FD |
| 07 | mc68340_UART_B_Internal_Loopback_Test | Line card | FD |
| 08 | mc68340_UART_B_External_Loopback_Tst(L) | Line card | FL |
| 09 | CP_to_DRAM_AddrBus_Indep_Test | Line card | FXM |
| 10 | CP_to_DRAM_AddrBus_Walking_1s_Test | Line card | FDM |
| 11 | CP_to_DRAM_AddrBus_Walking_0s_Test | Line card | FDM |
| 12 | CP_to_DRAM_DataBus_WalkingBit_Test | Line card | FDM |
| 13 | CP_to_DRAM_StuckBit_Memory_Test | Line card | FDM |
| 14 | CP_to_DRAM_RamData_Pattern_Test | Line card | FDM |
| 15 | CP_to_DRAM_Marching_1s_Test | Line card | FXM |
| 16 | CP_to_DRAM_Refresh_Test | Line card | FXM |
| 17 | CP_to_SharedMem_AddrBus_Indep_Test | Line card | FXM |
| 18 | CP_to_SharedMem_AddrBus_Walking_1s_Test | Line card | FDM |
| 19 | CP_to_SharedMem_AddrBus_Walking_0s_Test | Line card | FDM |
| 20 | CP_to_SharedMem_DataBus_WalkingBit_Test | Line card | FDM |
| 21 | CP_to_SharedMem_StuckBit_Memory_Test | Line card | FDM |
| 22 | CP_to_SharedMem_RamData_Pattern_Test | Line card | FDM |
| 23 | CP_to_SharedMem_Marching_1s_Test | Line card | FXM |
| 24 | CP_to_SharedMem_Refresh_Test | Line card | FXM |
| 25 | CP_to_SharedMem_Alignment_Test | Line card | FDM |
| 26 | CP_DRAM_Parity_Test | Line card | FDM |
| 27 | CP_SharedMem_Parity_Test | Line card | FDM |
| 28 | TCS_340_DRAM_Test | Line card | FDMT |
| 29 | CP_to_DRE_Mem_AddrBus_Indep_Test | Line card | FXM |
| 30 | CP_to_DRE_Mem_AddrBus_Walking_1s_Test | Line card | FDM |
| 31 | CP_to_DRE_Mem_AddrBus_Walking_0s_Test | Line card | FDM |
| 32 | CP_to_DRE_Mem_DataBus_WalkingBit_Test | Line card | FDM |
| 33 | CP_to_DRE_Mem_StuckBit_Memory_Test | Line card | FDM |
| 34 | CP_to_DRE_Mem_RamData_Pattern_Test | Line card | FDM |
| 35 | CP_to_DRE_Mem_Marching_1s_Test | Line card | FXM |
| 36 | CP_to_DRE_Mem_Alignment_Test | Line card | FDM |
| 37 | PP_to_LocalMem_AddrBus_Walking_1s_Test | Line card | FDM |
| 38 | PP_to_LocalMem_AddrBus_Walking_0s_Test | Line card | FDM |
| 39 | PP_to_LocalMem_DataBus_WalkingBit_Test | Line card | FDM |
| 40 | PP_to_LocalMem_RamData_Pattern_Test | Line card | FDM |
| 41 | CP_LineChip_Internal_Register_Test | Access card | FD |
| 42 | CP_LineChip_External_Register_Test | Access card | FD |
| 43 | CP_LineChip_Internal_Register_Test | Access card | FL |
| 44 | PaddleCard_Octart_Register_Test | Access card | FD |
| 45 | PaddleCard_Octart_Internal_Lpbk_Test | Access card | FD |
| 46 | PaddleCard_Octart_External_Lpbk_Test(L) | Access card | FL |
| 47 | PaddleCard_Octart_Interrupt_Test | Access card | FD |
| 48 | PaddleCard_Modem_Signals_Test | Access card | FD |
| 49 | PaddleCard_Internal_Clock_Monitor_Test | Access card | FD |
| 50 | PaddleCard_Extern_Clock_Monitor_Test(L) | Access card | FL |
| 51 | Serial_Eprom_Write_Read_Test | Access card | FDT |
| 52 | CP_RealTime_Clock_Test | Line card | FD |
| 53 | CP_CSR_A_Register_Test | Line card | FD |
| 54 | CP_CSR_B_Register_Test | Line card | FD |
| 55 | CP_CSR_C_Register_Test | Line card | FD |
| 56 | PP_to_LocalMem_AddrBus_Indep_Test | Line card | FXM |
| 57 | CP_to_SharedMem_AddrBus_Walking_1s_Test | Line card | FDM |
| 58 | PP_to_LocalMem_AddrBus_Walking_0s_Test | Line card | FDM |
| 59 | PP_to_LocalMem_DataBus_WalkingBit_Test | Line card | FDM |
| 60 | PP_to_LocalMem_StuckBit_Memory_Test | Line card | FDM |
| 61 | PP_to_LocalMem_RamData_Pattern_Test | Line card | FDM |
| 62 | PP_to_LocalMem_Marching_1s_Test | Line card | FXM |
| 63 | CP_to_SharedMem_AddrBus_Indep_Test | Line card | FXM |
| 64 | PP_to_SharedMem_AddrBus_Walking_1s_Test | Line card | FDM |
| 65 | PP_to_SharedMem_AddrBus_Walking_0s_Test | Line card | FDM |
| 66 | PP_to_SharedMem_DataBus_WalkingBit_Test | Line card | FDM |
| 67 | PP_to_SharedMem_StuckBit_Memory_Test | Line card | FDM |
| 68 | PP_to_SharedMem_RamData_Pattern_Test | Line card | FDM |
| 69 | PP_to_SharedMem_Marching_1s_Test | Line card | FXM |
| 70 | PP_to_SharedMem_Read_Modify_Write_Test | Line card | FDM |
| 71 | PP_to_DRE_Mem_AddrBus_Indep_Test | Line card | FXM |
| 72 | PP_to_DRE_Mem_AddrBus_Walking_1s_Test | Line card | FDM |
| 73 | PP_to_DRE_Mem_AddrBus_Walking_0s_Test | Line card | FDM |
| 74 | PP_to_DRE_Mem_DataBus_WalkingBit_Test | Line card | FDM |
| 75 | PP_to_DRE_Mem_StuckBit_Memory_Test | Line card | FDM |
| 76 | PP_to_DRE_Mem_RamData_Pattern_Test | Line card | FDM |
| 77 | PP_to_DRE_Mem_Marching_1s_Test | Line card | FXM |
| 78 | PP_Memory_Alignment_Test | Line card | FDM |
| 79 | PP_LineChip_Internal_Register_Test | Access card | FD |
| 80 | PP_RealTime_Clock_Test | Line card | FD |
| 81 | CP_to_PP_Interrupt_Test | Line card | FD |
| 82 | DRE_and_Shared_Memory_Arbitration_Test | Line card | FDM |
| 83 | FSU_BIU_Test | Line card | FD |
| 84 | FSU_BlinkLED_Test | Line card | FD |
| 85 | FSU_PCTL_Register_Ripple_Test | Line card | FD |
| 86 | FSU_PCTL_SRamData_Test | Line card | FD |
| 87 | FSU_KH_Complete_Test | Line card | FD |
| 88 | PCP_BIU_Test | Line card | FD |
| 89 | PCP_BlinkLED_Test | Line card | FD |
| 90 | PCP_DRAM_Test | Line card | FD |
| 91 | PCP_VRAM_Test | Line card | FD |
| 92 | PCP_SL_DMA_Reg_DMA_RW_Test | Line card | FD |
| 93 | PCP_SL_DRAM_Test | Line card | FD |
| 94 | PCP_SL_VRAM_Test | Line card | FD |
| 95 | PCP_SL_Enqueue_Join_Test | Line card | FD |
| 96 | PCP_SL_DRAM_VRAM_Test | Line card | FD |
| 97 | PCP_SL_Cell_Chopper_Test | Line card | FD |
| 98 | PCP_SL_Enqueuing_HW_Test | Line card | FD |
| 99 | PCP_SL_Extensive_DMA_Test | Line card | FD |
| 100 | PCP_SL_CMP_Contention_Test | Line card | FD |
| 101 | CMP_DRAM_Test | Line card | FD |
| 102 | CMP_SL_DRAM_Test | Line card | FD |
| 103 | CMP_SL_Dequeue_Cell_Test | Line card | FD |
| 104 | CMP_SL_Push_Cell_SOB_Test | Line card | FD |
| 105 | DataGram_SingleCast__Internal_Lpbk_Test | Line card | FD |
| 106 | DataGram_MultiCast___Internal_Lpbk_Test | Line card | FD |
| 107 | DataGram_Metered_____Internal_Lpbk_Test | Line card | FD |
| 108 | DataGram_MtCast_Metd_Internal_Lpbk_Test | Line card | FD |
| 109 | Isochronous_SinglCst_Internal_Lpbk_Test | Line card | FD |
| 110 | Isochronous_MultiCst_Internal_Lpbk_Test | Line card | FD |
| 111 | DataGram_SingleCast__External_Lpbk_Test | Line card | FS |
| 112 | DataGram_MultiCast___External_Lpbk_Test | Line card | FS |
| 113 | DataGram_Metered_____External_Lpbk_Test | Line card | FS |
| 114 | DataGram_MtCast_Metd_External_Lpbk_Test | Line card | FS |
| 115 | Isochronous_SinglCst_External_Lpbk_Test | Line card | FS |
| 116 | Isochronous_MultiCst_External_Lpbk_Test | Line card | FS |
| 117 | FSU_Dropped_Cell_Test_(PIT) | Line card | FD |
| 118 | FSU_RATO_Test_(PIT) | Line card | FD |
| No. | Name | Card | Notes |
|---|---|---|---|
| 01 | CP_Flash_Checksum_Test | Line card | FDM |
| 02 | mc68340_Chan1_DMA_DRAM_to_DRAM_Test | Line card | FD |
| 03 | mc68340_Chan2_DMA_DRAM_to_DRAM_Test | Line card | FD |
| 04 | mc68340_Timer1_Test | Line card | FD |
| 05 | mc68340_Timer2_Test | Line card | FD |
| 06 | mc68340_UART_A_Internal_Loopback_Test | Line card | FD |
| 07 | mc68340_UART_B_Internal_Loopback_Test | Line card | FD |
| 08 | CP_to_DRAM_StuckBit_Memory_Test | Line card | FDM |
| 09 | CP_to_DRAM_DataBus_WalkingBit_Test | Line card | FDM |
| 10 | CP_to_DRAM_AddrBus_Walking_1s_Test | Line card | FDM |
| 11 | CP_to_DRAM_AddrBus_Walking_0s_Test | Line card | FDM |
| 12 | CP_to_DRAM_RamData_Pattern_Test | Line card | FDM |
| 13 | CP_to_DRAM_Refresh_Test | Line card | FXM |
| 14 | CP_to_DRAM_AddrBus_Indep_Test | Line card | FXM |
| 15 | CP_to_DRAM_Marching_1s_Test | Line card | FXM |
| 16 | CP_CSR_A_Register_Test | Line card | FD |
| 17 | CP_CSR_B_Register_Test | Line card | FD |
| 18 | CP_CSR_C_Register_Test | Line card | FD |
| 19 | CP_to_TSU_CntrlRAM_StuckBit_Mem_Test | Line card | FDM |
| 20 | CP_to_TSU_CntrlRAM_DBus_WalkingBit_Test | Line card | FDM |
| 21 | CP_to_TSU_CntrlRAM_ABus_Walking_1s_Test | Line card | FDM |
| 22 | CP_to_TSU_CntrlRAM_ABus_Walking_0s_Test | Line card | FDM |
| 23 | CP_to_TSU_CntrlRAM_Data_Pattern_Test | Line card | FDM |
| 24 | CP_to_TSU_CntrlRAM_AddrBus_Indep_Test | Line card | FXM |
| 25 | CP_to_TSU_CntrlRAM_Marching_1s_Test | Line card | FXM |
| 26 | CP_to_CTP_PgmMem_DBus_WalkingBit_Test | Line card | FDM |
| 27 | CP_to_CTP_PgmMem_ABus_Walking_1s_Test | Line card | FDM |
| 28 | CP_to_CTP_PgmMem_ABus_Walking_0s_Test | Line card | FDM |
| 29 | CP_to_CTP_PgmMem_RamData_Pattern_Test | Line card | FDM |
| 30 | CP_to_TSU_Ctrl_FIFO_StuckBit_Mem_Test | Line card | FDM |
| 31 | CP_to_TSU_Ctrl_FIFO_ABus_Walking_1s_Tst | Line card | FDM |
| 32 | CP_to_TSU_Ctrl_FIFO_DBus_WalkingBit_Tst | Line card | FDM |
| 33 | CP_to_TSU_Ctrl_FIFO_RamData_Pattern_Tst | Line card | FDM |
| 34 | CP_to_FSU_Ctrl_FIFO_StuckBit_Mem_Test | Line card | FDM |
| 35 | CP_to_FSU_Ctrl_FIFO_ABus_Walking_1s_Tst | Line card | FDM |
| 36 | CP_to_FSU_Ctrl_FIFO_DBus_WalkingBit_Tst | Line card | FDM |
| 37 | CP_to_FSU_Ctrl_FIFO_RamData_Pattern_Tst | Line card | FDM |
| 38 | CP_to_FSU_CtrlSRAM_StuckBit_Mem_Tst | Line card | FDM |
| 39 | CP_to_FSU_CtrlSRAM_ABus_Walking_1s_Test | Line card | FDM |
| 40 | CP_to_FSU_CtrlSRAM_DBus_WalkingBit_Test | Line card | FDM |
| 41 | CP_to_FSU_CtrlSRAM_RamData_Pattern_Test | Line card | FDM |
| 42 | CTP_FifoA_StuckBit_Test | Line card | FDM |
| 43 | CTP_FifoA_AddrBus_Walking_1s_Test | Line card | FDM |
| 44 | CTP_FifoA_DataBus_WalkingBit_Test | Line card | FDM |
| 45 | CTP_FifoA_RamData_Pattern_Test | Line card | FDM |
| 46 | CTP_FifoB_StuckBit_Test | Line card | FDM |
| 47 | CTP_FifoB_AddrBus_Walking_1s_Test | Line card | FDM |
| 48 | CTP_FifoB_DataBus_WalkingBit_Test | Line card | FDM |
| 49 | CTP_FifoB_RamData_Pattern_Test | Line card | FDM |
| 50 | CTP_Control_Fifo_StuckBit_Test | Line card | FDM |
| 51 | CTP_Control_Fifo_AddrBus_Walking_1s_Test | Line card | FDM |
| 52 | CTP_Control_Fifo_DataBus_WalkingBit_Test | Line card | FDM |
| 53 | CTP_Control_Fifo_RamData_Pattern_Test | Line card | FDM |
| 54 | CTP_Control_Ram_StuckBit_Test | Line card | FDM |
| 55 | CTP_Control_Ram_AddrBus_Walking_1s_Test | Line card | FDM |
| 56 | CTP_Control_Ram_DataBus_WalkingBit_Test | Line card | FDM |
| 57 | CTP_Control_Ram_RamData_Pattern_Test | Line card | FDM |
| 58 | CTP_Cell_Buffer_StuckBit_Test | Line card | FDM |
| 59 | CTP_Cell_Buffer_AddrBus_Walking_1s_Test | Line card | FDM |
| 60 | CTP_Cell_Buffer_DataBus_WalkingBit_Test | Line card | FDM |
| 61 | CTP_Cell_Buffer_RamData_Pattern_Test | Line card | FDM |
| 62 | CP_DRAM_Parity_Test | Line card | FDM |
| 63 | CP_RealTime_Clock_Test | Line card | FD |
| 64 | SCastDgm_TrunkA_Fifo_Internal_Lpbk | Line card | FD |
| 65 | SCastDgm_TrunkB_Fifo_Internal_Lpbk | Line card | FD |
| 66 | SCastDgm_Cntrl__Fifo_Internal_Lpbk | Line card | FD |
| 67 | MCastDgm_TrunkA_Fifo_Internal_Lpbk | Line card | FD |
| 68 | MCastDgm_TrunkB_Fifo_Internal_Lpbk | Line card | FD |
| 69 | MCastDgm_Cntrl__Fifo_Internal_Lpbk | Line card | FD |
| 70 | SCastDgm_SWA_Cntrl__Fifo_External_Lpbk | Line card | FS |
| 71 | MCastDgm_SWA_Cntrl__Fifo_External_Lpbk | Line card | FS |
| 72 | SCastSch_SWA_Cntrl__Fifo_External_Lpbk | Line card | FS |
| 73 | MCastSch_SWA_Cntrl__Fifo_External_Lpbk | Line card | FS |
| 74 | SCastDgm_SWB_Cntrl__Fifo_External_Lpbk | Line card | FS |
| 75 | MCastDgm_SWB_Cntrl__Fifo_External_Lpbk | Line card | FS |
| 76 | SCastSch_SWB_Cntrl__Fifo_External_Lpbk | Line card | FS |
| 77 | MCastSch_SWB_Cntrl__Fifo_External_Lpbk | Line card | FS |
| 78 | FSU_Header_LRC_Error_Test | Line card | FD |
| 79 | FSU_Payload_LRC_Error_Test | Line card | FD |
| 80 | FSU_VRAM_Refresh_Test | Line card | FD |
| 81 | PaddleCard_Control_Status_Reg_Test | Access card | FD |
| 82 | PaddleCard_E3_Framer_Test | Access card | FD |
| 83 | PaddleCard_Serial_Eeprom_Test | Access card | FDT |
| 84 | PaddleCard_PLPP_Internal_Reg_Test | Access card | FD |
| 85 | T3/E3_PLPP_TrunkA_Fifo_PLPP_Int_Lpbk | Access card | FD |
| 86 | T3/E3_PLPP_TrunkB_Fifo_PLPP_Int_Lpbk | Access card | FD |
| 87 | E3_only_Framer_TrunkA_Fifo_Int_Lpbk | Access card | FD |
| 88 | E3_only_Framer_TrunkB_Fifo_Int_Lpbk | Access card | FD |
| 89 | T3/E3_PLPP_TrunkA_Fifo_LIM/MRT_Int_Lpbk | Access card | FD |
| 90 | T3/E3_PLPP_TrunkB_Fifo_LIM/MRT_Int_Lpbk | Access card | FD |
| 91 | T3/E3_PLPP_TrunkA_Fifo_Relay_Int_Lpbk | Access card | FD |
| 92 | T3/E3_PLPP_TrunkB_Fifo_Relay_Int_Lpbk | Access card | FD |
| 93 | T3/E3_PLPP_TrunkA_Fifo_External_Lpbk | Access card | FL |
| 94 | T3/E3_PLPP_TrunkB_Fifo_External_Lpbk | Access card | FL |
| 95 | PaddleCard_LED_Reg_Test | Access card | FD |
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